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Characterization of Interphase Regions Using Atomic Force Microscopy

Published online by Cambridge University Press:  10 February 2011

M. R. Vanlandingham ,
S. H. McKnight ,
G. R. Palmese ,
T. A. Bogetti ,
R. F. Eduljee  and
J. W. Gillespie Jr
M. R. Vanlandingham
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
S. H. McKnight
Affiliation:
Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD 21005–5069
G. R. Palmese
Affiliation:
Center for Composite Materials, University of Delaware, Newark, DE 19716–3144
T. A. Bogetti
Affiliation:
Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD 21005–5069
R. F. Eduljee
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
J. W. Gillespie Jr
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
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Abstract

The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date, diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 458: Symposium W – Interfacial Engineering for Optimized Properties , 1996 , 313
Copyright
Copyright © Materials Research Society 1997

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References

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