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Characterization of Interfaces Between Polymers and Metals by Static Sims
Published online by Cambridge University Press: 22 February 2011
Abstract
The use of static Secondary Ion Mass Spectrometry (SIMS) in the characterization of polymer surfaces and interfaces between polymers and metals is described. Examples are given of the use of SIMS to study the effects of plasma treatments on polyimide surfaces and for the analysis of the interface in metallized polytetrafluoroethylene (PTFE).
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- Research Article
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- Copyright © Materials Research Society 1989
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