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Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics

Published online by Cambridge University Press:  25 January 2013

Craig Wall ,
Sergei Magonov ,
Sergey Belikov  and
John Alexander
Craig Wall
Affiliation:
NT-MDT Development Inc., 430 W. Warner Rd., Tempe, AZ 85284, U.S.A.
Sergei Magonov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Rd., Tempe, AZ 85284, U.S.A.
Sergey Belikov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Rd., Tempe, AZ 85284, U.S.A.
John Alexander
Affiliation:
NT-MDT Development Inc., 430 W. Warner Rd., Tempe, AZ 85284, U.S.A.
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Abstract

Capabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices.

Keywords

scanning probe microscopy (SPM)photovoltaicelectrical properties
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1500: Symposium O – Next-Generation Polymer-Based Organic Photovoltaics , 2013 , mrsf12-1500-o06-25
Copyright
Copyright © Materials Research Society 2013

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References

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