Hostname: page-component-7479d7b7d-767nl Total loading time: 0 Render date: 2024-07-13T18:38:29.356Z Has data issue: false hasContentIssue false

Arsenic Diffusion and Precipitation at AsSG/Si Interface

Published online by Cambridge University Press:  28 February 2011

Yoshitaka Tsunashima
Affiliation:
TOSHIBA Co., ULSI Research Center, l. Komukai Toshiba-cho, Saiwaiku, Kawasaki 210, Japan
Takako Kashio
Affiliation:
TOSHIBA Co., ULSI Research Center, l. Komukai Toshiba-cho, Saiwaiku, Kawasaki 210, Japan
Hideichi Kawaguchi
Affiliation:
TOSHIBA Co., ULSI Research Center, l. Komukai Toshiba-cho, Saiwaiku, Kawasaki 210, Japan
Shinji Onga
Affiliation:
TOSHIBA Co., ULSI Research Center, l. Komukai Toshiba-cho, Saiwaiku, Kawasaki 210, Japan
Kikuo Yamabe
Affiliation:
TOSHIBA Co., ULSI Research Center, l. Komukai Toshiba-cho, Saiwaiku, Kawasaki 210, Japan
Get access

Abstract

In As diffusion process from AsSG films, As precipitation occurs at the AsSG/Si interface and functions as a diffusion barrier for As. This precipitation phenomenon is explained by the model based on the supersaturation of AsSG films.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Yamada, K., Yamabe, K., Tsunashima, Y., Imai, K., Kashio, T. and Tango, H., IEDM Tech. Dig., 702 (1985).Google Scholar
2. Arai, E. and Terunuma, Y., Jap. J. Appl. Phys., 9, 691 (1970).Google Scholar
3. Parekh, P.C., Goldstein, D.R. and Chan, T.C., Solid-State Electron., 14, 281 (1971).CrossRefGoogle Scholar
4. Wong, J. and Ghezzo, M., J. Electrochem. Soc., 119, 1413 (1972).CrossRefGoogle Scholar
5. Ghezzo, M. and Brown, D.M., J. Electrochem. Soc., 120, 110 (1973).Google Scholar
6. Sakurai, T., Nishi, H., Furuya, T., Hashimoto, H. and Shibayama, H., Appl. Phys. Lett., 22, 219 (1973).CrossRefGoogle Scholar
7. Itoh, T., Shinada, K., Ohmura, Y. and Kirita, K., J. Appl. Phys., 46, 1943 (1975).CrossRefGoogle Scholar
8. Beyer, K.D., J. Electrochem. Soc., 124, 630 (1977).Google Scholar
9. Celler, G.K., Trimble, L.E., West, K.W., Pfeiller, L. and Sheng, T.T., Appl. Phys. Lett., 50, 664 (1987).CrossRefGoogle Scholar