Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-29T00:20:47.644Z Has data issue: false hasContentIssue false

Application of Sans to Ceramic Characterization

Published online by Cambridge University Press:  28 February 2011

K. G. Frase
Affiliation:
Institute for Materials Science and Engineering, National Bureau of Standards, Gaithersburg MD 20899
K. A. Hardman-Rhyne
Affiliation:
Institute for Materials Science and Engineering, National Bureau of Standards, Gaithersburg MD 20899
N. F. Berk
Affiliation:
Institute for Materials Science and Engineering, National Bureau of Standards, Gaithersburg MD 20899
Get access

Abstract

Traditionally, small angle neutron scattering (SANS) has been used to study dilute concentrations of defects 1 -100 nm in size. Recent extensions of the scattering theory have allowed the expansion of the technique to include larger sizes through the use of multiple scattering. With multiple small angle neutron scattering, defects (pores, microcracks, precipitates) up to 10 μm in size can be studied. SANS is inherently a non-destructive, bulk probe of microstructure, with wide applications in the characterization of materials.

A number of studies of ceramic materials using multiple and traditional (single particle diffraction) small angle neutron scattering will be discussed. The emphasis will be on the strength of the technique in the characterization of materials. Particular examples will include: the assessment of pore size distributions in spinel compacts as a function of sintering and agglomeration, the characterization of primary and secondary particle sizes in precipitated aggregates, and the determination of microporosity in MDF cements.

Type
Articles
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Weertman, J. R., in Non-destructive Evaluations: Microstructural Characterization and Reliability Strategies, edited by Buck, O. and Wolf, S.M. (AIME, New York, 1981), pp. 147168.Google Scholar
2. Page, R.A. and Lankford, J., Comm. of the Amer. Ceram. Soc. C–146 (1983).Google Scholar
3. Glinka, C.J., Sander, L.C., Wise, S.A., Hunnicutt, M.L. and Lochmuller, C. H., Anal.Chem. 57, 20792084 (1985).Google Scholar
4. Case, E.D. and Glinka, C. J., J.Mat.Sci. 19, 2962 (1984).CrossRefGoogle Scholar
5. Berglund, K. A., Keefer, K. D. and Dosch, R. G., this conf.Google Scholar
6. Berk, N. F. and Hardman-Rhyne, K. A., J.Appl.Cryst. 18, 467472 (1985).CrossRefGoogle Scholar
7. Berk, N.F. and Hardman-Rhyne, K. A., Physica B, (1986), in press.Google Scholar
8. Hardman-Rhyne, K.A., Proc. of the 31st Sagamore Research Conference, August 1984, (Plenum Publ., New York, 1986) in press.Google Scholar
9. Hardman-Rhyne, K.A., Frase, K.G. and Berk, N.F., Physica B, (1986), in press.Google Scholar
10. Kostorz, G., in Treatise on Materials Science and Technology, Vol.15, edited by Kostorz, G. (Acad.Press, New York, 1979), pp. 58.Google Scholar
11. Pearson, D., Allen, A., Windsor, C.G., Alford, N.McN. and Double, D. D., J.Mat.Sci. 18, 430 (1983).CrossRefGoogle Scholar
12. Pearson, D. and Allen, A. J., J.Mat.Sci. 20, 303 (1985).CrossRefGoogle Scholar
13. Hardman-Rhyne, K. A., Coyle, T.D. and Lewis, E. P., this conf.Google Scholar
14. Glinka, C. J., AIP Conference Proc. 89, Neutron Scattering (1981), p.395.Google Scholar
15. Hardman-Rhyne, K. A. and Berk, N.F., J.Appl.Cryst. 18, 473479 (1985).CrossRefGoogle Scholar
16. Glinka, C. J., NBS SANS manual (internal publication).Google Scholar
17. Heistand, R., II., MIT-CPRL report #Q3, 18–20, (1984).CrossRefGoogle Scholar
18. G.Frase, K., to be published.Google Scholar
19. Chia, Yee-Ho (private communication)Google Scholar
20. Hardman-Rhyne, K. A., Berk, N. F. and Fuller, E. R. Jr J.Research (N.B.S.) 89, 17 (1984).Google Scholar
21. Frase, K. G. and Hardman-Rhyne, K. A., in preparation.Google Scholar