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Analytical Electron Microscopy of Precipitates in Ion-Implanted Mgal2O4 Spinel

Published online by Cambridge University Press:  16 February 2011

N. D. Evans ,
S. J. Zinkle  and
J. Bentley
N. D. Evans
Affiliation:
Oak Ridge Institute for Science and Education, PO Box 117, Oak Ridge, TN 37831-0117
S. J. Zinkle
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831–6376
J. Bentley
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831–6376
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Abstract

Analytical electron microscopy (AEM) has been used to investigate precipitates in MgAl2O4 spinel implantated with Al+, Mg+, or Fe2+ ions. Experiments combining diffraction, energy dispersive X-ray spectrometry (EDS), electron energy-loss spectrometry (EELS), and energy-filtered imaging were employed to identify and characterize precipitates observed in the implanted ion region. Diffraction studies suggested these are metallic aluminum colloids, although EELS and energy-filtered images revealed this to be so only for the Al+ and Mg+ implantations, but not for Fe2+ ion implantations. Multiple-least-squares (MLS) fitting of EELS plasmon spectra was employed to quantify the volume fraction of metallic aluminum in the implanted ion region. Energy-filtered plasmon images of the implanted ion region clearly show the colloid distribution in the Al+ and Mg+ implanted spinel. Energy-filtered images from the Fe2+ ion implanted spinel indicate that the features visible in diffraction contrast cannot be associated with either metallic aluminum or iron-rich precipitates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 373: Symposium Y – Microstructure of Irradiated Materials , 1994 , 419
Copyright
Copyright © Materials Research Society 1995

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References

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