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Analysis of the Strain Profile in Thin Au/Ni Multilayers by X-Ray Diffraction

Published online by Cambridge University Press:  22 February 2011

J. Chaudhuri ,
V. Gondhalekar  and
A. F. Jankowski
J. Chaudhuri
Affiliation:
Mech. Eng. Dept., National Inst. for Aviation Res., The Wichita State University, Wichita, KS 67208
V. Gondhalekar
Affiliation:
Mech. Eng. Dept., National Inst. for Aviation Res., The Wichita State University, Wichita, KS 67208
A. F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
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Abstract

A dynamical x-ray diffraction theory has been used to obtain microscopic strain profiles in thin Au/Ni multilayers. Depth profiles of strains in these multilayers, with repeat periodicities varying from 0.82 nm to 9.0 nm, are obtained by an iterative fitting of the calculated diffraction pattern with the experimental one. Interfacial coherency is found to play an important role in understanding the origin of the supermodulus effect in metallic multilayers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 208: Symposium J – Advances in Surface and Thin Film Diffraction , 1990 , 211
Copyright
Copyright © Materials Research Society 1991

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References

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