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Analysis Of Oxygen Distribution In Interfaces In SiC Whisker Reinforced Si3 N4-Based Composites.

Published online by Cambridge University Press:  25 February 2011

K. Das Chowdihury ,
R. W. Carpenter  and
W. Braue
K. Das Chowdihury
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ
R. W. Carpenter
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ
W. Braue
Affiliation:
German Aerospace Research Establishment, Cologne, D5000, Germany.
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Abstract

Discontinuous and continuous interfacial layers at the whisker/matrix and grain boundary interfaces in silicon carbide whisker reinforced silicon nitride based composites were investigated by high resolution electron imaging and analytical microscopy. Wide differences in chemical and structural widths of the interfaces were observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 238: Symposium Cb – Structure and Properties of Interfaces in Materials , 1991 , 421
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Braue, W., Carpenter, R. W. and Smith, D. J., J. Mat. Sci., 25, 2949 (1990).CrossRefGoogle Scholar
[2] Campbell, G. H., Dalgleish, B. J., Ruehle, M., and Evans, A. G., J. Am. Cer. Soc., 73, 521 (1990).CrossRefGoogle Scholar
[3] Das Chowdhury, K., Carpenter, R. W., and Braue, W., Ultramicroscopy, (1991) in press.Google Scholar
[4] Weiss, J. K., Rez, P., and Higgs, A. A., Ultramicroscopy (1991) in press.Google Scholar
[5] Das Chowdhury, K., Carpenter, R. W., and Braue, W., J. Am. Cer. Soc.,(1991) to be published.Google Scholar
[6] Lange, F. F., International Metal Reviews, 247 (1), 1 (1980).Google Scholar
[7] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press (1986).Google Scholar
[8] Braue, W., Woetting, G., and Zeigler, G., Sp. Ceramics, 8, 71 (1986).Google Scholar
[9] Clarke, D. R., Zaluzec, N. J., and Carpenter, R.K W., J. Am. Cer. Soc., 64 601 (1981).CrossRefGoogle Scholar
[10] Loehman, R. E., Ceramic Engg. and Science, 3, 35 (1982).CrossRefGoogle Scholar