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Analysis of NaF precursor layers during the different stages of the Cu(In,Ga)Se2 coevaporation process

Published online by Cambridge University Press:  28 August 2013

M. Edoff ,
P.M.P. Salomé ,
A. Hultqvist  and
V. Fjällström
M. Edoff
Affiliation:
Ångström Solar Center, Department of Engineering Sciences, Uppsala University P.O. Box 534, SE-751 21 Uppsala, Sweden
P.M.P. Salomé
Affiliation:
Ångström Solar Center, Department of Engineering Sciences, Uppsala University P.O. Box 534, SE-751 21 Uppsala, Sweden
A. Hultqvist
Affiliation:
Ångström Solar Center, Department of Engineering Sciences, Uppsala University P.O. Box 534, SE-751 21 Uppsala, Sweden
V. Fjällström
Affiliation:
Ångström Solar Center, Department of Engineering Sciences, Uppsala University P.O. Box 534, SE-751 21 Uppsala, Sweden
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Abstract

NaF precursor layers used for providing Na to Cu(In,Ga)Se2 (CIGS) grown on Na-free substrates have been studied. The NaF layers were deposited on top of the Mo back contact prior to the CIGS co-evaporation process. The co-evaporation process was interrupted after the preheating steps, and after part of the CIGS layer was grown. Completed samples were also studied. After the preheating, the NaF layers were analyzed with X-ray Photoelectron Spectroscopy and after growing part and all of the CIGS film, the Mo/NaF/CIGS stack was characterized using transmission electron microscopy (TEM) and secondary ion mass spectrometry (SIMS). The NaF layers were found to be stable in thickness and composition during the pre-heating in selenium containing atmosphere before the CIGS process. The TEM analyses on the partly grown samples show a layer at the CIGS/Mo interface, which we interpret as a partly consumed NaF layer. This is corroborated by the SIMS analysis. In finalized samples the results are less clear, but TEM images show an increased porosity at the position of the NaF layer.

Keywords

Naphotovoltaicx-ray photoelectron spectroscopy (XPS)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1538: Symposium C – Compound Semiconductors: Thin-Film Photovoltaics, LEDs and Smart Energy Controls , 2013 , pp. 9 - 14
Copyright
Copyright © Materials Research Society 2013 

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References

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