Hostname: page-component-7479d7b7d-qlrfm Total loading time: 0 Render date: 2024-07-13T01:49:02.106Z Has data issue: false hasContentIssue false
  • English
  • Français

Admittance Spectroscopy on Polymer Light-Emitting Diodes

Published online by Cambridge University Press:  21 March 2011

P.W.M. Blom ,
H.C.F. Martens ,
H.B. Brom  and
J.N. Huiberts
P.W.M. Blom
Affiliation:
Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
H.C.F. Martens
Affiliation:
Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands
H.B. Brom
Affiliation:
Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands
J.N. Huiberts
Affiliation:
Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands
Get access

Abstract

From admittance spectroscopy measurements on poly(p-phenylene vinylene) based light-emitting diodes various relaxation processes can be observed. At low bias inductive contributions due to the transit of charge carriers dominate, at high bias capacitive contributions as a result of charge redistribution appears. These processes reveal a transition from space-charge limited to recombination limited behavior, as is also indicated by the current-voltage characteristics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 665: Symposium C – Electronic, Optical and Optoelectronic Polymers and Oligomers , 2001 , C3.3
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Burroughes, J.H., Bradley, D.D.C., Brown, A.R., Marks, R.N., Mackey, K., Friend, R.H., Burn, P.L., and Holmes, A.B., Nature 347, 539 (1990).Google Scholar
2. Lampert, M.A. and Mark, P., Current injection in solids (Academic, New York, 1970).Google Scholar
3. Blom, P.W.M., Jong, M.J.M. de, and Vleggaar, J.J.M., Appl. Phys. Lett. 68, 3308 (1996).Google Scholar
4. Martens, H.C.F., Huiberts, J.N., and Blom, P.W.M., Appl. Phys. Lett. 77, 1852 (2000).Google Scholar
5. Bozano, L., Carter, S.A., Scott, J.C., Malliaras, G.G., and Brock, P.J., Appl. Phys. Lett. 74, 1132 (1999).Google Scholar
6. Blom, P.W.M., and Jong, M.J.M. de, IEEE J. Sel. Top. Quant. Elect. 4, 105 (1998).Google Scholar
7. Blom, P.W.M., Jong, M.J.M. de, and Munster, M.G. van, Phys. Rev. B. 55, R656 (1997).Google Scholar
8. MacDonald, J.R., Impedance Spectroscopy (John Wiley & Sons, New York, 1987).Google Scholar
9. Martens, H.C.F., Brom, H.B., and Blom, P.W.M., Phys. Rev. B 60, R8489 (1999).Google Scholar
10. Martens, H.C.F., Huiberts, J.N., and Blom, P.W.M., Appl. Phys. Lett. 77, 1852 (2000).Google Scholar