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Visualizing Langmuir-Blodgett Films with the Atomic Force Microscope

Published online by Cambridge University Press:  21 February 2011

Ravi Viswanathan ,
D.K. Schwartz ,
L.L. Madsen  and
J.A. Zasadzinski
Ravi Viswanathan
Affiliation:
Dept. of Chemical & Nuclear Engineering, University of California, Santa Barbara, CA 93106
D.K. Schwartz
Affiliation:
Dept. of Chemistry and Biochemistry, University of California, Los Angeles, CA 90024
L.L. Madsen
Affiliation:
Dept. of Chemical & Nuclear Engineering, University of California, Santa Barbara, CA 93106
J.A. Zasadzinski
Affiliation:
Dept. of Chemical & Nuclear Engineering, University of California, Santa Barbara, CA 93106
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Abstract

The Atomic Force Microscope (AFM) has created exciting new possibilities for imaging thin organic films under ambient conditions at length scales ranging from tens of microns to the sub - molecular scale. We present images of thin organic films prepared by the Langmuir-Blodgett (LB) technique that demonstrate the possibilities of the AFM.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 429
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1. Roberts, G.G, Advances in Physics 34,475 (1985)CrossRefGoogle Scholar
2. Bonnerot, A., Chollet, P.A., Frisby, H., and Hoclet, M., J. Chem. Phys. 97, 365 (1985);Google Scholar
3. Garoff, S., Deckman, H.W., Dunsmuir, J.H., and Alvarez, M.S., J. Phys. 47, 701 (1986)CrossRefGoogle Scholar
4. BOhm, C., Seitz, R., and Riegler, H., Thin Solid Films, 178,511 (1989)CrossRefGoogle Scholar
5. Peterson, I.R., Seitz, R., Krug, H., and Voigt-Martin, I., J. Phys. (France), 51, 1003 (1990)CrossRefGoogle Scholar
6. Seul, M., Eisenberger, P., and McConnell, H. M., Proc. Natl. Acad. Sci. 80, 5795 (1983); M. Prakash, P., J.B. Ketterson, and B.M. Abraham, Chem. Phys. Lett. 111,395 (1984)CrossRefGoogle Scholar
7. Tippmann-Krayer, P., Kenn, R. M., and Mohwald, H., Thin Solid Films, 210, 577 (1992).CrossRefGoogle Scholar
8. Pomerantz, M. and Segmiiller, A., Thin Solid Films, 68, 33 (1980)CrossRefGoogle Scholar
9. Fischetti, R. F., Skita, V., Garito, A. F., and Blasie, J. K., Phys. Rev. B 37, 4788 (1988); S. Xu, A. Murphy, S.M. Amador, and J.K. Blasie, J. Phys. I (France), 1, 1131 (1991)CrossRefGoogle Scholar
10. Skita, V., Richardson, W., Filiplowski, M., Garito, A., and Blasie, J.K., J. Phys., 47, 1849 (1986); V. Skita, M. Filipkowski, A. F. Garito, and J. K. Blasie, Phys. Rev B., 34, 5826 (1986)CrossRefGoogle Scholar
11. Bloch, J.M., Yun, W.B., and Mohanty, K.M., Phys. Rev. B. 40,6529 (1989)CrossRefGoogle Scholar
12. Outka, D.A., Stöhr, J., Rabe, J.P., Swalen, J.D., and Rotermund, H.H., Phys. Rev. Lett. 59, 1321 (1987)CrossRefGoogle Scholar
13. Claesson, P. M. and Berg, J. M., Thin Solid Films 176, 157 (1989)CrossRefGoogle Scholar
14. Rothberg, L., Higashi, G.S., Allara, D.L., and Garoff, S., Chem. Phys. Lett. 133, 67 (1987); J.P. Rabe, J.D. Swalen, and J.F. Rabolt, J. Chem. Phys. 86, 1601 (1987); T. Nakanaga, M. Matsumoto, Y. Kawabata, H. Takeo, and C. Matsamura, Chem. Phys. Lett. 160, 129 (1989).CrossRefGoogle Scholar
15. Stroeve, P., Srinivasan, M. P., Higgins, B. G., and Kowel, S. T., Thin Solid Films, 146, 209–216 (1987).CrossRefGoogle Scholar
16. Maoz, R. and Sagiv, J., J. Coll. Inter. Sci., 100, 465 (1984); F. Kimura, J. Umemura, T. Takenaka, Langmuir, 2, 96 (1986); M. Shimomura, K. Song, and J.F. Rabolt, Langmuir, 8, 887 (1992)CrossRefGoogle Scholar
17. Egger, M. et al, J. Struct. Biol., 103, 89 (1990); E. Meyer, et al, Nature 349, 398 (1991); J.A.N. Zasadzinski et al, Biophys. J. 59, 755 (1991); L. Bourdieu, P. Silberzan, and D. Chatenay, Phys. Rev. Lett. 67, 2029 (1991).CrossRefGoogle Scholar
18. Smith, D. P. E. et al, Proc. Nat. Acad. Sci. USA, 84, 969–972 (1987); J. P. Rabe and S. Buchholz, Phys. Rev. Lett., 66, 2096-2099 (1991); J.K.H. Horber et al, Chem. Phys. Lett. 145, 151 (1988).CrossRefGoogle Scholar
19. Hansma, H. G., Gould, S. A. C., Hansma, P. K., Gaub, H. E., Longo, M. L., and Zasadzinski, J. A. N., Langmuir, 7, 1051 (1991).CrossRefGoogle Scholar
20. Viswanathan, R., Schwartz, D. K., Garnaes, J., and J. Zasadzinski, A. N., Langmuir, 8, 1603 (1992).CrossRefGoogle Scholar
21. Garnaes, J., Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., Nature, 357, 54 (1992).CrossRefGoogle Scholar
22. Schwartz, D.K., Garnaes, J., Viswanathan, R., and Zasadzinski, J.A.N., Science 257, 508 (1992).CrossRefGoogle Scholar
23. Schwartz, D.K., Garnaes, J., Viswanathan, R., Chiruvolu, S., and Zasadzinski, J.A.N., Phys. Rev. E 47, 452 (1993).CrossRefGoogle Scholar
24. Viswanathan, R., Schwartz, D.K., and Zasadzinski, J.A.N., Science 261, 449 (1993).CrossRefGoogle Scholar
25. Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., J. Am. Chem. Soc., 115, 7374 (1993).CrossRefGoogle Scholar
26. Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., Phys. Rev. Lett. 70, 1267 (1993).CrossRefGoogle Scholar
27. Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., Langmuir 9, 1384 (1993).CrossRefGoogle Scholar
28. Viswanathan, R., Schwartz, D.K., and Zasadzinski, J.A.N., submitted to Nature.Google Scholar
29. Millipore Corporation, Bedford, MA.Google Scholar
30. NIIMA Technology Ltd., Warwick Science Park, Coventry, CV4 7EZ, England.Google Scholar
31. Digital Intruments, Inc., Santa Barbara.Google Scholar
32. Kitaigorodskii, A.I., Organic Chemical Crystallography, (Consultants Bureau, New York, 1961), Ch. 3.Google Scholar
33. Ueno, K. et al, J. Vac. Sci. Tech. A 8, 68 (1990).CrossRefGoogle Scholar
34. Koma, A., Saiki, K., and Sato, Y., Appl. Surf. Sci. 41/42, 451 (1989).CrossRefGoogle Scholar
35. Ohuchi, F.S. et al, J. Appl. Phys. 68, 2168 (1990).CrossRefGoogle Scholar
36. Steitz, R., Mitchell, E.E., and Peterson, I.R., Thin Solid Films 205, 124 (1991).CrossRefGoogle Scholar
37. Schwartz, D.K., Schlossman, M.L., and Pershan, P.S., J. Chem. Phys. 96, 2356 (1992).CrossRefGoogle Scholar
38. Prakash, M., Peng, J.B., Ketterson, J.B., and Dutta, P., Chem. Phys. Lett. 128, 354 (1986).CrossRefGoogle Scholar
39. Brock, J.D. et al. , Z. Phys. B. 74, 197 (1989).CrossRefGoogle Scholar
40. Halperin, B.I. and Nelson, D.R., Phys. Rev. Lett. 41, 121 (1978); D.R. Nelson and B.I. Halperin, Phys. Rev. B 19, 2457 (1979).CrossRefGoogle Scholar
41. Brock, J. D. et al. , Cont. Phys. 30, 321 (1989).CrossRefGoogle Scholar
42. Cheng, M. et al. , Phys. Rev. Lett. 59, 1112 (1987).CrossRefGoogle Scholar
43. Cheng, M. et al. , Phys. Rev. Lett. 61, 550 (1988).CrossRefGoogle Scholar
44. Pindak, R., Moncton, D.E., Davey, S.C., and Goodby, J.W., Phys. Rev. Lett. 46, 1135 (1981).CrossRefGoogle Scholar
45. Brock, J.D. et al. , Phys. Rev. Lett. 57, 98 (1986).CrossRefGoogle Scholar
46. Moncton, D.E. and Pindak, R., Phys. Rev. Lett. 43,701 (1979).CrossRefGoogle Scholar