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Surface Stress Effects On The Critical Thickness Of Thin Film Superlattices

Published online by Cambridge University Press:  10 February 2011

R. C. Cammarata  and
K. Sieradzki
R. C. Cammarata
Affiliation:
Department of Materials Science and Engineering, The Johns Hopkins University, Baltimore, MD 21218, USA
K. Sieradzki
Affiliation:
Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287–6106, USA
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Abstract

Surface stress represents the reversible work per unit area to elastically stretch a solid surface, and can be associated with interfaces between two solid phases as well as free solid surfaces. The effects of surface stresses on the critical thickness for epitaxy in thin film superlattices is given.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 505 , 1997 , 475
Copyright
Copyright © Materials Research Society 1998

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References

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