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Surface Ordering and Kinetics From Atom Beam Diffraction

Published online by Cambridge University Press:  22 February 2011

B. J. Hinch
B. J. Hinch*
Affiliation:
A.T.&T. Bell Laboratories, Murray Hill, NJ 07974, USA
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Abstract

Helium atom diffraction yields a wealth of information complementary to that obtainable from other experimental surface sensitive techniques. Atomic He scattering is extremely sensitive to surface defects. Also time of flight measurements enable energy transfer processes to be studied. An analysis of the energy broadening in quasi-elastic scattering can yield information on surface diffusion coefficients and may also be used to investigate diffusion mechanisms. The paper reviews how intensities of both coherent and incoherent scattering can be employed to study the kinetics of ordering at surfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 208: Symposium J – Advances in Surface and Thin Film Diffraction , 1990 , 75
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Davisson, J. and Germer, L. H., Phys. Rev. 30 705 (1927).CrossRefGoogle Scholar
2. Toennies, J. P. and Winkelmann, K., J. Chem. Phys. 66 3965 (1977).CrossRefGoogle Scholar
3. Engel, T. and Rieder, K.H., in: Structural Studies of Surfaces, Springer Tracts in Modern Physics, 31, Springer, Berlin, 1982; and J. A. Barker and D. J. Auerbach, Surf. Sci. Repts. 41 (1984).Google Scholar
4. Lock, A., Hinch, B. J. and Toennies, J. P., in: Kinetics of Ordering and Growth at Surfaces, Acquafredda di Maratea, Italy, Sept. 1989, Plenum Press.Google Scholar
5. Lillienkamp, G. and Toennies, J. P., J. Chem Phys. 78 5210 (1983).CrossRefGoogle Scholar
6. Toennies, J. P., J. Vac. Sci. Technol. A 5 440 (1987).CrossRefGoogle Scholar
7. Lahee, A. M., Manson, J. R., Toennies, J. P. and Wöll, Ch., J. Chem. Phys. 86 7194 (1987).CrossRefGoogle Scholar
8. Lahee, A. M., Manson, J. R., Toennies, J. P. and Wöll, Ch., Phys. Rev. Lett. 57 471 (1986).CrossRefGoogle Scholar
9. Hinch, B. J., Phys. Rev. B 38 5260 (1988).CrossRefGoogle Scholar
10. Hinch, B. J., Lock, A., Toennies, J. P and Zhang, G., J. Vac. Sci. Technol. B 7 1260 (1989).CrossRefGoogle Scholar
11. Skorupka, C. W. and Manson, J. R., Phys. Rev. B 41 8156 (1990).CrossRefGoogle Scholar
12. Houston, I. E. and Park, R. L., Surf. Sci. 26 269 (1971); W. Aldhart, Acta. Crystallogr. Sect. A 37 794 (1981); M. Henzler, Appl. Surf. Sci. 11/12 450 (1982); and M. G. Lagally, D. E. Savage and M. C. Tringides, in: Reflection High Energy Diffraction and Reflection Electron Imaging of Surfaces, P. K. Larson and P. 1. Dobson (eds.). Plenum Publishing Corporation, 1988.CrossRefGoogle Scholar
13. Hinch, B. J. and Toennies, J. P., Phys. Rev. B 42 1209 (1990).CrossRefGoogle Scholar
14. Hinch, B. J., Lock, A., Madden, H. H, Toennies, J. P. and Witte, G., Phys. Rev. B 42 1547 (1990).CrossRefGoogle Scholar
15. Conrad, E. Aten, R., Kaufman, D, Allen, L., Engel, T., den Nijs, M and Riedel, E., J. Chem. Phys. 84 1015 (1986); E. Conrad, L. Allen, D. Blanchard T. Engel, Surf. Sci. 187 265 (1987); D. L. Blanchard, D. F. Thomas, H. Xu and T. Engel, Surf. Sdi. 222 477 (1989).CrossRefGoogle Scholar
16. Fabre, F., Salanon, B. and Lapujoulade, J, Sol. St. Comm. 64 1125 (1987); B. Salanon, F. Fabre, J. Lapujoulade and W. Seike, Phys. Rev. B 38 7385 (1988); F. Fabre, D. Gorse, J. Lapujoulade and B. Salanon, Euro. Phys. Lett. 3 737 (1987).CrossRefGoogle Scholar
17. Burton, W. K., Cabrera, N. and Frank, F. C., Phil. Trans. Roy. Soc. 243A 299 (1951).Google Scholar
18. Villain, J., Grempel, D. R. and Lapujoulade, J., J. Phys. F 15 809 (1985).CrossRefGoogle Scholar
19. Poelsema, B. and Comsa, G., in: Scattering of Thermal Energy Atoms from Disordered Surfaces, Springer Tracts in Modem Physics, 115, Springer Verlag Heidelberg 1989.Google Scholar
20. Gomez, L. J., Bourgeal, S., Ibafiez, J. and Salmeron, M., Phys. Rev. B 31 2551 (1985); J.J. De Miguel, A. Sanchez, A. Cebollada, J.M. Gallego, J. Ferron and S. Ferrer, Surf. Sci. 189/190 1062 (1987); J. Ellis, E. McCash and W. Allison, to be published.CrossRefGoogle Scholar
21. Neave, J. H., Joyce, B. A., Dobson, P. J. and Norton, N., Appl. Phys. A 31 1 (1983).Google Scholar
22. Hinch, B. J., Kozior, C., Toennies, J. P and Zhang, G., Euro. Phys. Lett. 10 341 (1989).CrossRefGoogle Scholar
23. Schulte, K. F., Surf. Sci. 55 427 (1976).CrossRefGoogle Scholar
24. Van Hove, L., Phys. Rev. 95 249 (1954).CrossRefGoogle Scholar
25. Levi, A. C., Spadacini, R. and Tommei, G. E., Surf. Sci. 182 557 (1987).Google Scholar
26. Frenken, J. W. M. and Hinch, B. J., in: He scattering: A Gentle and Sensitive Tool in Surface Science, (ed. Hulpke, E.), Springer Verlag 1990.Google Scholar
27. Frenken, J. W. M., Maree, P. M. J., van der Veen, J. F, Phys. Rev. B 34 7506 (1986).CrossRefGoogle Scholar
28. Frenken, J. W. M., Toennies, J. P. and Wöll, Ch., Phys. Rev. Lett. 60 1727 (1988).CrossRefGoogle Scholar
29. Vineyard, G. H., Phys. Rev. 110 999 (1958).CrossRefGoogle Scholar
30. Chudley, C. T. and Elliot, R. J., Proc. Phys. Soc. 77 353 (1961).CrossRefGoogle Scholar
31. Frenken, J. W. M., Hinch, B. J., Toennies, J. P. and Wöll, Ch., Phys. Rev. B 41 938 (1990).CrossRefGoogle Scholar
32. Bienfait, M., Zeppenfeld, P., Gay, J. M. and Palmari, J. P., Surf. Sci. 226 327 (1990) and M. Bienfait, Euro. Phys. Lett. 4 79 (1987).CrossRefGoogle Scholar