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Scanning Transmission X-Ray Microscopy Study of TiSe2/NbSe2 Superlattices

Published online by Cambridge University Press:  10 February 2011

Hyun-Joon Shin ,
Kwangho Jeong ,
David C. Johnson ,
Stephen D. Kevan ,
Myungkeun Noh  and
Tony Warwick
Hyun-Joon Shin
Affiliation:
Pohang Accelerator Lab., POSTECH, Pohang, Korea
Kwangho Jeong
Affiliation:
Department of Physics, YonSei University, Seoul, Korea
David C. Johnson
Affiliation:
Materials Science Institute, University of Oregon, Eugene, OR 97403
Stephen D. Kevan
Affiliation:
Materials Science Institute, University of Oregon, Eugene, OR 97403
Myungkeun Noh
Affiliation:
Materials Science Institute, University of Oregon, Eugene, OR 97403
Tony Warwick
Affiliation:
Advanced Light Source, Berkeley, CA 94710
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Abstract

TiSe2/NbSe2 superlattices crystallized from elementally modulated films have been studied with a Scanning Transmission X-ray Microscope (STXM) at the Advanced Light Source. The samples exhibited structures in the plane of the film with sizes of the order of one micrometer. The chemical sensitivity of STXM allowed us to infer that the titanium in the superlattice exists predominantly in microcrystalline TiSe2, but that these microcrystals are interspersed with elemental titanium inclusions. The STXM images reflect the interfacial nucleation between the constituent layers characteristic of the kinetic trapping method.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 441: Thin Films – Structure and Morphology , 1996 , 603
Copyright
Copyright © Materials Research Society 1997

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