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Real-time Degradation Study of HgBa2CaCu2O6+δ?Thin Film Using Near-field Scanning Microwave and Optical Dual Probe

Published online by Cambridge University Press:  18 March 2011

Roberto S. Aga Jr
Affiliation:
Department of Physics and Astronomy, University of Kansas, Lawrence, KS 66045, U.S.A.
Yi-Yuan Xie
Affiliation:
Department of Physics and Astronomy, University of Kansas, Lawrence, KS 66045, U.S.A.
Judy Z. Wu
Affiliation:
Department of Physics and Astronomy, University of Kansas, Lawrence, KS 66045, U.S.A.
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Abstract

All high- Tc superconductors are susceptible to humid environment. The mechanism behind this degradation process is not yet well known or even described. In an attempt to understand the mechanism, we studied the real-time degradation process of HgBa2CaCu2O6+δ (Hg-1212) thin film using scanning probe microscopy (SPM) techniques. A newly developed near-field scanning microwave and optical dual probe was employed to map simultaneously the spatial variation of microwave sheet resistance and optical transmittance of a sample. Mapping was performed at a regular time interval while the sample was exposed to a very high level of humidity (85%-90%). In a separate experiment, atomic force microscope (AFM) was used to monitor the surface roughness of a sample subjected to the same level of humidity. Results indicate that the degradation process of Hg-1212 involves the gradual transformation of the material into a colorless insulator accompanied by continuous surface deformations.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

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Real-time Degradation Study of HgBa2CaCu2O6+δ?Thin Film Using Near-field Scanning Microwave and Optical Dual Probe
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Real-time Degradation Study of HgBa2CaCu2O6+δ?Thin Film Using Near-field Scanning Microwave and Optical Dual Probe
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