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P-type Mg-doped GaN grown by molecular beam epitaxy using ammonia as the nitrogen source

Published online by Cambridge University Press:  21 February 2011

Z. Yang
Affiliation:
Department of Electrical Engineering, Columbia University, New York, NY 10027
L.K. Li
Affiliation:
Department of Electrical Engineering, Columbia University, New York, NY 10027
W.I. Wang
Affiliation:
Department of Electrical Engineering, Columbia University, New York, NY 10027
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Abstract

The electrical and luminescent properties of Mg-doped GaN films grown by molecular beam epitaxy (MBE) using ammonia as the nitrogen source have been investigated. Due to their different growth environments, the Mg-doped GaN films grown by MBE using ammonia exhibited properties that were different from similar films grown by metal-organic chemical vapor deposition (MOCVD). It has been found that the introduction of positive charges during growth is important in the achievement of p-type Mg-doped GaN grown by MBE using ammonia. With the introduction of a moderate nitrogen plasma, we have achieved p-type Mg-doped GaN films with a hole density of 4×1017 cm−3 and a mobility of 15 cm2/V-s at room temperature.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1 Pankove, J.I., Mater. Res. Soc. Symp. Proc. 97, 409 (1987).Google Scholar
2 Marfaing, Y., Prog. Crystal Growth Charact. 4, 317 (1981).Google Scholar
3 Mandel, G., Phys. Rev. 134, A1073 (1964)Google Scholar
4 Van Vechten, J. A., Zook, J. D., Horning, R. D., and Goldenberg, B., Jpn. J. Appl. Phys. 31, 3662(1992).Google Scholar
5 Amano, H., Kito, M., Hiramatsu, K. and Akasaki, I., Jpn. J. Appl. Phys. 28, L2112 (1989).Google Scholar
6 Nakamura, S., Mukai, T., Senoh, M. and Iwasa, N., Jpn. J. Appl. Phys. 31, (1992) LI39.Google Scholar
7 Nakamura, S., Senoh, M., and Mukai, T., Jpn. J. Appl. Phys. 30, L1998 (1991).Google Scholar
8 Asif Khan, M., Chen, Q., Skogman, R.A. and Kuznia, J.N., Appl. Phys. Lett. 66, 2046(1995).Google Scholar
9 Molnar, R. J. and Moustakas, T. D., J. Appl. Phys. 76, 4587 (1994).Google Scholar
10 Ohtan, A., Stevens, K. S., and Beresford, R., Appl. Phys. Lett., 65, 61(1994).Google Scholar
11 Yoshida, Y., Misawa, S. and Gonda, S., J. Vac. Sci. Technol. B1, 250(1983).Google Scholar
12 Yang, Z., Li, L.K. and Wang, W.I., Appl. Phys. Lett., 67, 1686(1995).Google Scholar
13 Wang, W.I., Appl. Phys. Lett. 44, 1149 (1984).Google Scholar
14 Akiyama, M., Kawarada, Y., and Kaminishi, M., Jpn. J. Appl. Phys. 23, L843 (1984)Google Scholar