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Optical Properties of C60 and M6C60 (M=K, Rb, Cs) films

Published online by Cambridge University Press:  25 February 2011

S. L. Ren
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506.
Ying Wang
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506.
M. Holden
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506.
A. M. Rao
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506.
F. Ni
Affiliation:
Center for Applied Energy Research, University of Kentucky, Lexington, KY 40506.
W. Lee
Affiliation:
Center for Applied Energy Research, University of Kentucky, Lexington, KY 40506.
G. T. Hager
Affiliation:
Center for Applied Energy Research, University of Kentucky, Lexington, KY 40506.
P. C. Eklund
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506. Center for Applied Energy Research, University of Kentucky, Lexington, KY 40506.
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Abstract

We report the optical properties of C60 determined from the variable angle ellipsometry and near normal incidence reflection / transmission (R.T) experiments, and of M6C60 from the R, T experiments. The measurements were performed on thin films (d∼1000 Å) of C60 and M6C60 deposited on both Si(100) and suprasil substrates. The onset for strong absorption across the HOMO-LUMO gap in CgQ is measured to be -2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy (XPS) and electron-energy-loss spectroscopy (EELS) experiments. The observed peak positions in ε2(ω) for M6C60 and C60 compares well with the recent band structure calculations and suggests that the M6C60 compounds exhibit only a weak hybridization between the C60 and M states.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

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