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Observation of Heteroepitaxially Grown Organic Ultrathin Layers on Inorganic Substrates by In Situ RHEED and by STM

Published online by Cambridge University Press:  25 February 2011

Masahiko Hara
Affiliation:
Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351–01, JAPAN
Hiroyuki Sasabe
Affiliation:
Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351–01, JAPAN
Akira Yamada
Affiliation:
Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351–01, JAPAN
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Abstract

An organic molecular beam epitaxy (OMBE) system has been designed and constructed with in situ reflection high-energy electron diffraction (RHEED) specifically for the deposition of organic molefelar layers under ultrahigh vacuum (UHV), the order of 10–10 torr. The system is equipped with a portable UHV chamber which allows easy transfer of the OMBE film samples to a separate UHV scanning tunneling microscopy (STM) system. A structural investigation of heteroepitaxially grown organic ultrathin layers of copper phthalocyanine (CuPc) on inorganic substrates was carried out by the combined UHV system from less than a monolayer of CuPc.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1. Hara, M., Sasabe, H., Yamada, A. and Garito, A.F., Jpn. J. Appl. Phys. 28, L306 (1989).CrossRefGoogle Scholar
2. Wilson, J.A. and Yoffe, A.D., Adv. Phys. 18, 193 (1969).CrossRefGoogle Scholar
3. Ashida, M., Bull. Chem. Soc. Jpn. 39, 2632 (1966).CrossRefGoogle Scholar

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Observation of Heteroepitaxially Grown Organic Ultrathin Layers on Inorganic Substrates by In Situ RHEED and by STM
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Observation of Heteroepitaxially Grown Organic Ultrathin Layers on Inorganic Substrates by In Situ RHEED and by STM
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