Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-07-01T14:56:55.049Z Has data issue: false hasContentIssue false

A Nonlinear and Time Dependent Finite Element Analysis of Solder Joints in Surface Mounted Components Under Thermal Cycling

Published online by Cambridge University Press:  26 February 2011

Yi-Hsin Pao
Affiliation:
Research Staff, Ford Motor Company, Dearborn, MI 48121-2053
Kuan-Luen Chen
Affiliation:
Structural Integrity Associates, Inc., San Jose, CA 95118
An-Yu Kuo
Affiliation:
Structural Integrity Associates, Inc., San Jose, CA 95118
Get access

Abstract

A nonlinear and time dependent finite element analysis was performed on two surface mounted electronic devices subjected to thermal cycling. Constitutive equations accounting for both plasticity and creep for 37Pb/63Sn and 90Pb/10Sn solders were assumed and implemented in a finite element program ABAQUS with the aid of a user subroutine. The FE results of 37Pb/63Sn solder joints were in reasonably good agreement with the experimental data by Hall [19]. In the case of 9OPb/1OSn solder in a multilayered transistor stack, the FE results showed the existence of strong peel stress near the free edge of the joint, in addition to the anticipated shear stress. The effect of such peel stress on the crack initiation and growth as a result of thermal cycling was discussed, together with the singular behavior of both shear and peel stresses near the free edge.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Frear, D. R., Grivas, D., and Morris, J. W. Jr,J. Metals, 40,(6), 18(1988).Google Scholar
2. Solomon, H. D.,GE Research Report No. 87CRD186,(1987).Google Scholar
3. Tien, J. K., Hendrix, B. C., and Attarwala, A. I.,IEEE Trans. Comp. Hybrids, Manuf. Technol.,12 (4),502(1989).Google Scholar
4. Solomon, H. D.,Brazing and Soldering, (11), 68(1986).Google Scholar
5. Vaynman, S.,IEEE Trans. Comp. Hybrids, Manuf. Technol., 12 (4), 469(1989).Google Scholar
6. Kashyap, B. P. and Murty, G. S.,Mater. Sci. and Eng.,(50),205(1981).Google Scholar
7. Wilcox, J. R., , Subrahamanyan, and , U. C.-Y., Microelectronic Packaging Technolog. Materials and Processes (Proc. 2nd ASM Int. Elec. Mater. and Process. Congr., Philadelphia, PA 1989)pp. 203211.Google Scholar
8. Knecht, S. and Fox, L R., to appear in Solder Joint Reliability,. Theory and Apolications. edited by Lau, J. H.(1989).Google Scholar
9. Engelmaier, W.,IEEE Trans. Comp. Hybrids, Manuf. Technol.,6,(3), 232(1983).Google Scholar
10. Liljestrand, L -G. and Andersson, L -O., Circuit Word 14 (3),69(1988).Google Scholar
11. Engelmaier, W. and Attarwala, A. I., IEEE Trans. Comp. Hybrids, Manuf. Technol., 12, (2), 284(1989).Google Scholar
12. Lau, J. H., J. Elec. Pack., Trans. ASME 2 (111),2(1989).Google Scholar
13. Pan, T. Y. and Winterbottom, W. L., (ASME Winter Annual Meeting, Dallas, TX 1990),90-WA/EEP-13.Google Scholar
14. Lavery, P. R., M.S. Thesis, Dartmouth College, NH(1987).Google Scholar
15. Media, A. A., M.S. Thesis, Dartmouth College, NH(1990).Google Scholar
16. Wong, B., Helling, D. E., and Clark, R. W., IEEE Trans. Comp. Hybrids, Manuf. Technol., 11, (3), 284(1988).Google Scholar
17. Frost, H. J. and Ashby, M. F., Deformation Mechanism Maps, (Pergamon Press Ltd, 1982).Google Scholar
18. ABAQUS-Theory Manual (Hibbitt, Karlsson, and Sorensen, Inc., Providence, RI, 1990).Google Scholar
19. Hall, P., IEEE Trans. Comp. Hybrids, Manuf. Technol., 7, (4), 314(1984).Google Scholar