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Microwave Materials Dielectric Measurements

Published online by Cambridge University Press:  28 February 2011

Don Purinton
Affiliation:
Texas Instruments Inc., MS 8019, McKinney, Texas 75069
Leon Stiborek
Affiliation:
Texas Instruments Inc., MS 8019, McKinney, Texas 75069
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Abstract

Texas Instruments Defense Systems and Electronics Group develops radars, missile systems, infra-red systems and electronic systems for the Defense Department. Materials having special microwave properties are needed for radar systems, missile systems that home on microwave emissions, microwave emitter locator systems, and jamming systems. The microwave materials appear in the form of antennas, lenses, radomes, windows, dielectric loading materials, potting materials, dielectric transmission lines, microwave absorbing materials, adhesives, sealants, coatings, and foams. Naturally, the complex permittivity and permeability of these materials need to be known to enhance their application and control their properties in manufacturing. Texas Instruments has a microwave materials test laboratory that includes permittivity and permeability measurements as well as physical and thermal properties. The samples come in many different forms, measurement at different frequencies are needed and the electrical properties cover a wide span (conductors to dielectrics and foams to ferrites). For this reason, many different methods of dielectric and magnetic measurement are used. These various methods will be discussed below.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1 , Tice, , Thomas, Techniques for Airborne Radome Design, Vol I ch 2.Google Scholar
2 Walton, JD. Jr., Radome Engineering Handbook, Ch 2, Marcel Dekker 1970.Google Scholar
3 , Ness, , John, Broadband Permittivity Measurements Using the Semi-Automatic Network Analyzer, Vol. MTT–33 no. 11, November 85. pg 1222.Google Scholar
4. , Kent, , Brian, and , Chizever, , Hirsch, An Automated Frequency domain Microwave Absorber Measurement System for K-Band, AFWAL-TR-85-1081.Google Scholar
5. , Larson, , Clayton, A Frequency Domain Metrology System for Measuring Permittivity and Permeability. Oct 22, 1980, RAM symposium Orlando Fla.Google Scholar
6. , Aguirre, Donald, G, Frequency Domain Measurements of Microwave Absorber Design Materials. AFIT/GE/EE/80D-8, Dec 1980.Harrington, Roger F., Time Harmonic Electromagnetic Fields, Chapter 5 and problem 7 chapter 7.8. Afsar, Mo, dielectric Measurements of Millimeter-Wave Materials, IEEE Vol MTT-32 no 12, Dec 84.Google Scholar
9. , Moore, , Rick, Dielectric Properties of Window Components at MM Wave Frequencies. Proc. 19th, Symposium EM Windows, Vol II, Sept 7-9, 1988, Georgia Institute of Tech. Google Scholar
10. AFAL-TR-68-97, Symposium on EM Windows, June 68, Proceedings Vol II, page 277.Google Scholar