Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-20T02:44:08.281Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of the Thermoelectric Properties of Quasicrystalline AlPdRe and AlCuFe Alloys.

Published online by Cambridge University Press:  15 February 2011

M.L. Wilson ,
S. Legault ,
R.M. Stroud  and
T.M. Tritt
M.L. Wilson
Affiliation:
Department of Physics and Astronomy, Clemson University, Clemson SC
S. Legault
Affiliation:
McGill University, Department of Physics and Astronomy, Montreal Canada
R.M. Stroud
Affiliation:
Naval Research Laboratory, Washington D.C.
T.M. Tritt
Affiliation:
Department of Physics and Astronomy, Clemson University, Clemson SC
Get access

Abstract

We report the measurement of the thermal conductivity, electrical resistivity, and thermoelectric power on two quasicrystalline compounds, A170Pd20Re10 and A162.5Cu25Fe12.5. These materials are found to posses a thermal conductivity of order 1 W/m K, while retaining their semimetallic conductivity. These features coupled with moderately large thermopowers, up to 55 μV/K, imply that the general class of quasicrystalline compounds warrants careful investigation for their potential as new thermoelectric materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 478: Symposium Q – Thermoelectric Materials - New Directions and Approaches , 1997 , 321
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Coldman, A.I. and Kelton, R.I., Rev. Mod. Phys. 65, 2193 (1993).Google Scholar
2 Poon, S.J., Adv. Phys. 41, 303 (1992).Google Scholar
3 Janot, C., Quasicrystals, Clarendon Press, Oxford.Google Scholar
4 Chernikov, M.A., Bianchi, A., and Ott, H.R., Phys. Rev. B 51, 153 (1995).Google Scholar
5 Klein, T., Berger, C., Mayou, D., and Cyrot-Lackmann, F., Phys. Rev. B 66, 2907 (1991).Google Scholar
6 Tamura, R., Waseda, A., Kimura, K., and Ino, H., Phys. Rev. B 50, 9640 (1994).Google Scholar
7 Honda, Y., Edagawa, K., Takeuchi, S., Tsai, A.-P. and Inoue, A., Jpn. J. Appl. Phys. 34, 2415 (1995).Google Scholar
8 Pierce, F.S., Poon, S.J., and Biggs, B.D., Phys. Rev. Lett. 70, 3919 (1993).Google Scholar
9 kasner, G., Schwabe, H. and Bottger, H., Phys. Rev. B 51, 10454 (1995).Google Scholar
10 Burkov, S.E., Varlamov, A.A. and Livanov, D.V, Phys. Rev. B 53, 11504 (1996).Google Scholar
11 Mizutani, U., Yamada, Y., Takeuchi, T., Hashimoto, K., Belin, E., Sadoc, A., Yamauchi, T. and Matsuda, T., J. Phys: Conds. Matter 6, 7335 (1994).Google Scholar