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Light-induced Open-circuit Voltage Increase in Amorphous Silicon/Microcrystalline Silicon Tandem Solar Cells

Published online by Cambridge University Press:  20 June 2011

Xiaodan Zhang
Affiliation:
Institute of Photo-electronic Thin Film Devices and Technology of Nankai University, Weijin Road 94#, Nankai District, Tianjin 300071, P.R.China
Guanghong Wang
Affiliation:
Institute of Photo-electronic Thin Film Devices and Technology of Nankai University, Weijin Road 94#, Nankai District, Tianjin 300071, P.R.China
Shengzhi Xu
Affiliation:
Institute of Photo-electronic Thin Film Devices and Technology of Nankai University, Weijin Road 94#, Nankai District, Tianjin 300071, P.R.China
Shaozhen Xiong
Affiliation:
Institute of Photo-electronic Thin Film Devices and Technology of Nankai University, Weijin Road 94#, Nankai District, Tianjin 300071, P.R.China
Xinhua Geng
Affiliation:
Institute of Photo-electronic Thin Film Devices and Technology of Nankai University, Weijin Road 94#, Nankai District, Tianjin 300071, P.R.China
Ying Zhao
Affiliation:
Institute of Photo-electronic Thin Film Devices and Technology of Nankai University, Weijin Road 94#, Nankai District, Tianjin 300071, P.R.China
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Abstract

Light-induced metastability of amorphous/microcrystalline (micromorph) silicon tandem solar cell, in which the microcrystalline bottom cell was deposited in a single-chamber system, has been studied under a white light for more than 1000 hours. Two different light-induced metastable behaviors were observed. The first type was the conventional light-induced degradation, where the open-circuit voltage (Voc), fill factor (FF), and short-circuit current density (Jsc) were degraded, hence the efficiency was degraded as well. This phenomenon was observed mainly in the tandem cells with a bottom cell limited current mismatch. The second type was with a light-induced increase in Voc, which sometimes resulted in an increase in efficiency. The second type of light-induced metastability was observed in the tandem cells with a top cell limited current mismatch. The possible mechanisms for these phenomena are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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