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Kinetics of Interface Reactions in Polycrystalline Thin Films

Published online by Cambridge University Press:  15 February 2011

Rüdiger Bormann
Rüdiger Bormann*
Affiliation:
Institute for Materials Research, GKSS Research Center, 21502 Geesthacht, Germany
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Abstract

A quantitative description of the nucleation and growth kinetics determining the interface reactions between two phases is given. Particular focus is given to the understanding of the mechanisms causing the distinct phase selection occurring during the early stages of interface reaction. Thereby the microstructure of the parent phases and the new phases formed are also taken into account and discussed with respect to their influence on the phase selection. The conclusions are applied to the results of two model systems, Al-Ni and Zr-Ni.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 343: Symposium H – Polycrystalline Thin Films - Structure, Texture, Properties and Applications , 1994 , 169
Copyright
Copyright © Materials Research Society 1994

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References

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