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Ionic Conductivities of Doped CeO2 Thin Films as Related to Their Microstructure

Published online by Cambridge University Press:  10 February 2011

Chunyan Tian  and
Siu-Wai Chan
Chunyan Tian
Affiliation:
Department of Chemical Engineering, Materials Science and Mining Engineering, Henry Krumb School of Mines, Columbia University, New York, NY 10027
Siu-Wai Chan
Affiliation:
Department of Chemical Engineering, Materials Science and Mining Engineering, Henry Krumb School of Mines, Columbia University, New York, NY 10027
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Abstract

Thin films of 4% Y2O3 doped CeO2/Pd film/(001)LaA103 with a very low pinhole density were successfully prepared using electron-beam deposition technique. The microstructure of the films was characterized by x-ray diffraction and the electrical properties were studied as a function of temperature with AC impedance spectroscopy. A brick layer model was adopted to correlate the electrical properties to the microstructure of the films, which can be simplified as either a series or a parallel equivalent circuit associated with either a fine grain or a columnar grain structure, respectively. The conductivities of the films fell between the conductivities derived from the two circuit models, suggesting that the films are of a mixed fine grain and columnar grain structure. The measured dielectric constants of the films were found smaller than that of the bulk.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 411: Symposium T – Electricaly-Based Microstructural Characterization , 1995 , 277
Copyright
Copyright © Materials Research Society 1996

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References

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