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Intercluster Interaction of TiO2 Nanoclusters Using Variable-Charge Interatomic Potentials

Published online by Cambridge University Press:  21 February 2011

Shuji Ogata
Affiliation:
Department of Applied Sciences, Yamaguchi University, Ube 755-8611, Japanogata@po.cc.yamaguchi-u.ac.jp
Hiroshi Iyetomi
Affiliation:
Department of Physics, Niigata University, Niigata 950-2181, Japan
Kenji Tsuruta
Affiliation:
Departnent of Electrical and Electronic Engineering, Okayama University, Okayama 700-8530, Japan
Fuyuki Shimojo
Affiliation:
Faculty of Integrated Arts and Sciences, Hiroshima University, Higashi-Hiroshima 739-8521, Japan
Rajiv K. Kalia
Affiliation:
Concurrent Computing Laboratory for Materials Simulations, Louisiana State University, Baton Rouge, LA 70803-4001
Aiichiro Nakano
Affiliation:
Concurrent Computing Laboratory for Materials Simulations, Louisiana State University, Baton Rouge, LA 70803-4001
Priya Vashishta
Affiliation:
Concurrent Computing Laboratory for Materials Simulations, Louisiana State University, Baton Rouge, LA 70803-4001
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Abstract

A new interatomic potential has been developed for molecular-dynamics simulations of TiO2 based on the formalism of Streitz and Mintmire [J. Adhesion Sci. Technol. 8, 853 (1994)], in which atomic charges vary dynamically according to the generalized electronegativity-equalization principle. The present potential reproduces various quantities of rutile crystal including vibrational density of states, static dielectric constants, melting temperature, elastic moduli, and surface relaxation. Calculated cohesive-energy and dielectric constants for anatase crystal agree well with experimental data. The potential is applied to TiO2 nanoclusters (size 60-80Å) for both anatase and rutile phases to analyze their equilibrium configuration and spacecharge distribution. Stable double-charge layer is found in the surface region of a spherical nanocluster for both rutile and anatase, resulting in enhanced Coulomb-repulsion between the nanoclusters at close proximity.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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