Skip to main content Accessibility help
×
Home
Hostname: page-component-59b7f5684b-b2xwp Total loading time: 0.354 Render date: 2022-09-26T10:16:20.325Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "useRatesEcommerce": false, "displayNetworkTab": true, "displayNetworkMapGraph": false, "useSa": true } hasContentIssue true

In-situ Observations of Martensitic Transformation in Pure Ti Thin Films using the Dynamical Transmission Electron Microscope (DTEM)

Published online by Cambridge University Press:  26 February 2011

Thomas Bradley LaGrange
Affiliation:
lagrange2@llnl.gov, Lawerence Livermore Natioan Laboratory, Chemistry and Materials Science, Materials Science and Technology Division, 7000 East Avenue, P.O. Box 808, Mail Stop, L-353, Livermore, CA, 94550, United States, (925) 454-0713
Geoffrey H. Campbell
Affiliation:
campbell7@llnl.gov
Jeffrey D. Colvin
Affiliation:
colvin5@llnl.gov
Wayne E. King
Affiliation:
weking@llnl.gov
Nigel D. Browning
Affiliation:
browning20@llnl.gov
Michael R. Armstrong
Affiliation:
armstrong30@llnl.gov
Bryan W. Reed
Affiliation:
reed12@llnl.gov
Judy S. Kim
Affiliation:
kim46@llnl.gov
Brent C. Stuart
Affiliation:
stuart3@llnl.gov
Get access

Abstract

We have measured the transient events of the α-β martensitic transformation in nanocrystalline Ti films via single shot electron diffraction patterns with 1.5 ns temporal resolution. This was accomplished with a newly constructed dynamic transmission electron microscope (DTEM), which combines pulsed laser systems and pump-probe techniques with a conventional TEM. The DTEM thereby enables studies of transformations that are (1) far too fast to be captured by conventional bulk techniques, and (2) difficult to study with current ultrafast electron diffraction (UED) instruments (which typically require an accumulation of multiple shots for each diffraction pattern). Martensitic transformations in nanocrystalline materials meet both criteria, with their rapid nucleation, characteristic interface velocities ∼1 km/s, and significant irreversible microstructural changes. Free-standing 40-nm-thick Ti films were laser-heated at a rate of ∼1010 K/s to a temperature above the 1155 K transition point, then probed at various time intervals with a 1.5-ns-long intense electron pulse. Diffraction patterns show an almost complete transition to the β phase within 500 ns. Post-mortem analysis (after the sample is allowed to cool) shows a reversion to the α phase coupled with substantial grain growth, lath formation, and texture modification. The cooled material also shows a complete lack of apparent dislocations, suggesting the possible importance of a "massive" short-range diffusion mechanism.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Smith, C. S., in Martensite, edited by Olson, G. B. and Owen, W. S., (ASM International, 1992) pp. 2139;Google Scholar
Raghavan, V. ibid pp. 197225.Google Scholar
2 Bostanjoglo, O., Elschner, R., Mao, Z., Nink, T. and Weingärtner, M., “Nanosecond electron microscopes,” Ultramicroscopy, 81 (3 - 4) (2000), 141147.CrossRefGoogle ScholarPubMed
3 King, W. E., Campbell, G. H., Frank, A., Reed, B., Schmerge, J. F., Siwick, B. J., Stuart, B. C., and Weber, P. M., J. Appl. Phys., 97, 111101 (2005).CrossRefGoogle Scholar
4 Lütjering, G. and Williams, J. C., in Titanium, (Springer-Verlag Berlin Heidelberg, NewYork, 2003) p. 27.CrossRefGoogle Scholar
5 6. OH, M.S., Lee, J. Y., and Park, J. K., Metall. and Mat. Trans. A, 35A, 3071 (2004).CrossRefGoogle Scholar
6 Cormier, M. adn Claisse, F., Journal of Less-Common Metals, 34, 181 (1974).CrossRefGoogle Scholar
7 Campbell, G. H., LaGrange, T. B., King, W. E., Colvin, J. D., Ziegler, A., Browning, N. D., Kleinschmidt, H.., and Bostanjaglo, O., in Proceeding of the Solid-Solid Phase Transformations in Inorganic Materials Conference 2005, (TMS, Warrendale PA, 2005).Google Scholar

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

In-situ Observations of Martensitic Transformation in Pure Ti Thin Films using the Dynamical Transmission Electron Microscope (DTEM)
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

In-situ Observations of Martensitic Transformation in Pure Ti Thin Films using the Dynamical Transmission Electron Microscope (DTEM)
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

In-situ Observations of Martensitic Transformation in Pure Ti Thin Films using the Dynamical Transmission Electron Microscope (DTEM)
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *