Hostname: page-component-5c6d5d7d68-sv6ng Total loading time: 0 Render date: 2024-08-07T12:23:28.188Z Has data issue: false hasContentIssue false

A Grazing Incidence X-Ray Study Of Interfacial Reactions In Al-Cu

Published online by Cambridge University Press:  26 February 2011

S. M. Heald
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
H. Chen
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
J. M. Tranquada
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
Get access

Abstract

The Al-Cu system has been used to test the application of grazing incidence EXAFS and x-ray reflectivity measurements to interface systems. Both techniques have been found to be sensitive to compound formation and interdiffusion, and with further development of analysis procedures should be very useful complements to more traditional techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Wildman, H. S., Howard, J. K., and Ito, P. S., J. Vac. Sci. Technol. 12, 75 (1975).Google Scholar
2. Shearer, M. P., Bauer, C. L., Jordan, A. G., Thin Solid Films 61, 273 (1979).Google Scholar
3. Hentzell, H. T. G., Thompson, R. D., and Tu, K. N., J. Appl. Phys. 54, 6923 (1983).Google Scholar
4. Hamm, R. A. and Vandenberg, J. M., J. Appl. Phys. 56, 293 (1984).Google Scholar
5. Hentzell, H. T. G. and Tu, K. N., J. Appl. Phys. 54, 6929 (1983).Google Scholar
6. See for example: Stern, E. A. and Heald, S. M., “Basic Principles and Applications of EXAFS” in Handbook of Synchrotron Radiation, edited by Koch, E. E. (North Holland, Amsterdam, 1983) p. 955.Google Scholar
7. Parratt, L. G., Phys. Rev. 95., 359 (1954).Google Scholar
8. Vidal, B. and Vincent, P., Appl. Opt. 23, 1794 (1984).Google Scholar
9. Bilderback, D. H., “Reflecting Optics for Synchrotron Radiation,” Proc. SPIE 315, 90 (1981).Google Scholar