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Grazing Incidence X-Ray Scattering Study of Surface Defects

Published online by Cambridge University Press:  26 February 2011

K. S. Liang  and
P. Eisenberger
K. S. Liang
Affiliation:
Corporate Research Science Laboratories EXXON Research and Engineering Company Annandale, NJ 08801
P. Eisenberger
Affiliation:
Corporate Research Science Laboratories EXXON Research and Engineering Company Annandale, NJ 08801
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Abstract

Grazing incidence x-ray scattering is emerging to become an important structural probe for surface and interface studies, especially in conjunction with the development of high brilliant synchrotron sources. In this paper, we give a brief review of the experimental principle and examples of how the technique can be applied to study surface defects.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 493
Copyright
Copyright © Materials Research Society 1987

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References

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