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Generation of Blind Via-Holes for a High Density Multi-Chip-Module Using Excimer Lasers

Published online by Cambridge University Press:  21 February 2011

Friedrich G. Bachmann*
Affiliation:
Siemens AG, Corporate Production and Logistics Department, Otto-Hahn-Ring 6, D-8000 MOnchen 83, Fed. Rep. Germany
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Abstract

In recent years the on-chip delay has gone down much more rapidly than the signal delay in packaged circuits. As a consequence of this the packaging delay times have had to be reduced drastically, which means that a greater packging density had to be implemented. A novel planar packaging technique, used in the new Siemens main frame computer 7500 H 90 has led to considerable progress in solving this problem. An essential part of this system is a multi-chip-module which can hold up to 144 bare chips. The carrier of these IC's is a 16-layer high density multilayer printed circuit board, which is fabricated in a sequential process. Interlayer contacts are formed by 80 µm wide blind via-holes, which are generated by excimer-laser ablation of the dielectric. The process desribed in this paper shows that it is possible to produce blind via-holes with an aspect ratio of about one in an extremely reliable and reproducible way. This process is already being successfully run on a production line. It is to our best knowledge the first time excimer lasers have been used on a large-scale in an industrial environment.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

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