Hostname: page-component-848d4c4894-8bljj Total loading time: 0 Render date: 2024-06-23T04:18:17.405Z Has data issue: false hasContentIssue false

Fast-Iccd Photography and Gated Photon Counting Measurements of Blackbody Emission from Particulates Generated in The KrF-Laser Ablation of BN and YBCO

Published online by Cambridge University Press:  01 January 1992

David B. Geohegan*
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831–6056
Get access

Abstract

Fast intensified CCD photography and gated photon counting following KrF-laser irradiation of YBCO and BN targets reveal the first observations of very weak emission from slow-moving ejecta up to 2 cm from the target and times extending to ∼1.5 ms. Time-of-flight velocities inferred from the emission measurements indicate velocities (v ˜ (0.45−1.2) x 104 cm s−1) comparable to those measured for the large particles which often accompany the pulsed laser deposition process. Gated photon counting is employed to obtain temporally resolved spectra of this weak emission. The spectral shape is characteristic of blackbody emission, which shifts to longer wavelengths as the particles cool during flight in vacuum. Estimates of the temperature of the particles are made based on the emissivity of a perfect blackbody and range from 2200 K to 3200 K for both BN and YBCO when irradiated at Φ248 = 3.5 J cm−2 and 1.5 J cm−2, respectively. The temperature decrease of the particles in vacuum is compared to a radiative cooling model which gives estimates of the initial surface temperature and radii of the particles.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Murakami, K., p.125 in Laser Ablation of Electronic Materials: Basic Mechanisms and Applications, ed. by Fogarassy, E. and Lazare, S., North Holland (1992).Google Scholar
2. Ivanov, A. A., Galkin, S. G., Kuznetsov, A. V., Menushenkov, A. P., Physica C 180, 69 (1991).Google Scholar
3. Koren, G., Gupta, A., Baseman, R. J., Lutwyche, M. I., and Laibowitz, R. B., Appl. Phys. Lett. 56, 2144 (1990).Google Scholar
4. Dupendant, H., Gavigan, J. P., Givord, D., Lienard, A., Rebouillat, J. P., and Souche, Y., Appl. Surf. Sci., 43, 369 (1989).Google Scholar
5. Bhattacharya, Deepika, Singh, R. K., and Holloway, P. H., J. Appl. Phys. 70, 5433 (1991).Google Scholar
6. Kelly, R., Cuomo, J. J., Leary, P. A., Rothenberg, J. E., Braren, B. E. and Aliotta, C. F., Nucl. Instrum. Methods B 9, 329 (1985).Google Scholar
7. Singh, R. K., Bhattacharya, D., and Narayan, J., Appl. Phys. Lett. 57, 2022 (1990).Google Scholar
8. Rohlfing, Eric A., J. Chem. Phys., 89, 6103 (1988).Google Scholar
9. Geohegan, D. B., Appl. Phys. Lett. 60, 2732 (1992).Google Scholar
10. Gupta, A., Braren, B., Casey, K. G., Hussey, B. W., and Kelly, Roger, Appl. Phys. Lett. 59, 1302 (1991).Google Scholar
11. Scott, K., Huntley, J. M., Phillips, W. A., Clarke, John, and Field, J. E., Appl. Phys. Lett., 57, 922 (1990).Google Scholar
12. Fried, Daniel, Kushida, T., Reck, G. P. and Rothe, E. W., J. Appl. Phys. 72 1113, (1992).Google Scholar
13. Dyer, P. E., Issa, A., Key, P. H., Appl. Surf. Sci., 46 89 (1990).Google Scholar
14. Eryu, O., Murakami, K., Masuda, K., Kasuya, A., and Nishina, Y., Appl. Phys. Lett. 54, 2716 (1989).Google Scholar
15. Geohegan, D. B., Thin Solid Films, in press.Google Scholar
16. Geohegan, D. B., submitted to Applied Physics Letters.Google Scholar
17. Krasnoperov, V. A., Vekshina, N. V., Khusidman, M. B., and Neshpor, V. S., Zhurnal Prikladnoi Spektroskopii 11(2) 299 (1969). Translated in J. Appl. Spectrosc. p. 931, August 1969.Google Scholar
18. Wang, Y., Zhang, X., Zhou, Y., and Wang, J., J. Lumin. 45, 165 (1990).Google Scholar
19. Geohegan, D. B. and Mashburn, D. N., Appl. Phys. Lett. 55, 2345 (1989).Google Scholar