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Fabrication and Optical Characterization of Silicon Carbide Nanofibers

Published online by Cambridge University Press:  01 February 2011

Saima Khan ,
Aurangzeb Khan  and
Martin E. Kordesch
Saima Khan
Affiliation:
saima@phy.ohiou.edu, Ohio University, Physics & Astronomy, ., Athens, OH, 45701, United States
Aurangzeb Khan
Affiliation:
khan@phy.ohiou.edu, Ohio University, Physics & Astronomy, Athens, OH, 45701, United States
Martin E. Kordesch
Affiliation:
kordesch@phy.ohiou.edu, Ohio University, Physics & Astronomy, Athens, OH, 45701, United States
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Abstract

Silicon Carbide (SiC) nanofibers were synthesized from SiC powder dispersed in polyethylene oxide (PEO) solution in Chloroform using the electrospinning technique. The as-spun fibers were then annealed at 1000ËC to 7 hours. The average diameter of the annealed fibers is 500 nm while the length of the annealed fibers is about 50 µm. The fibers were characterized using scanning electron microscope (SEM), X-ray diffraction (XRD) and Cathodoluminescence (CL). PL spectra from the annealed SiC fibers show a broad emission in the red-infrared spectral regime. The main peak is centered at 774 nm while the shoulder on the left is at 740 nm

Keywords

polymerannealingoptical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1006: Symposium R – Transport Behavior in Heterogeneous Polymeric Materials and Composites , 2007 , 1006-R01-08
Copyright
Copyright © Materials Research Society 2007

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References

[1] Powell, J. A., Matus, L. G., Kuczmarski, M. A., Electrochem, A. J.. Soc. 134, 1558, (1998).Google Scholar
[2] Choyke, W. J., Penske, G., Mater. Res. Soc. Bull. 22, 25, (1997).CrossRefGoogle Scholar
[3] Larkin, D. J., Mater. Res. Soc. Bull. 22, 36, (1997).CrossRefGoogle Scholar
[4] KAMLAKARAN, R., LUPO, F., GROBERT, N., SCHEU, T., PHILLIPP, N. Y. J. and RUHLE, M., Carbon 42,1 (2004).Google Scholar
[5] Kamlakaran, R., Lupo, F., Grobert, N., Scheu, T., Phillip, N.Y.J. and Ruhle, M., Carbon 42, 1 (2004).CrossRefGoogle Scholar
[6] Raman, V., Bhatia, G., Bhardwaj, S., Srivastva, A. K., Sood, K. N., Journal of materials science 40, 1521–1527, (2005).CrossRefGoogle Scholar
[7] Fisher, A., Schroter, B., Richter, W., Appl. Phys. Lett. 66 (23), 3182, (1995).Google Scholar
[8] Feng, Z. C., Mascarenhas, A. J., Choyke, W. J., Powell, J. A., J. Appl. Phys. 64, 3176, (1998).CrossRefGoogle Scholar
[9] Dai, H., Wang, E. W., Lu, Y. Z., Fan, S., Lieber, C. M., Nature 375, 769 (1995).CrossRefGoogle Scholar
[10] Wu, Z. S., Deng, S. Z., Xu, N. S., Chen, J., Zhou, J., Chen, , J. Appl. Phys. Lett. 80, 3829 (2002).CrossRefGoogle Scholar
[11] Zhou, X. T., Lai, H. L., Peng, H. Y., Frederick, C. K. A., Liao, L.S., Wang, N., Bello, I., Chem. Phys. Lett. 318, 58 (2000).CrossRefGoogle Scholar
[12] Zhou, X. T., Wang, N., Frederick, C. K. A., Lai, H. L., Peng, H. Y., Bello, I., Lee, C. S., Lee, S. T., Mater. Sci. Eng., A 2000, 286, 119 (A 2000).CrossRefGoogle Scholar
[13] Lai, H. L., Wong, N. B., Zhou, X. T., Peng, H. Y., Au, F. C. K., Wang, N., Bello, I., Lee, C. S., Lee, S. T., Duan, X. F., Appl. Phys. Lett., 76, 294 (2000).CrossRefGoogle Scholar
[14] Wong, K.W., Zhou, T., Au, C.K., Lai, H.L., Lee, C.S., Lee, S.T., Appl.Phys.Lett. 75, 2918. (1999).CrossRefGoogle Scholar
[15] , Shin.ichi-Honda, Baek, Yang-Gyu, Ikunu, Takashi, Kohara, Hidekazu, Katayama, Mitsuhiro, Oura, Kinjiru, Takashi Hirao Applied Surface Science 212-213, 378–382 (2003).Google Scholar
[16] Liu, J. W., Zhong, D. Y., Xie, F. Q., Sun, M., Wang, E.G., Liu, W. X. Chemical Physics Letters 348, 357–360 (2001).CrossRefGoogle Scholar
[17] Patel, N., Kawal, R., Oya, A. Journal of materials science 39, 691–693 (2004).CrossRefGoogle Scholar
[18] Ishikawa, T., Kohtoku, Y., , Kumagawa, Yamamura, T., Nagasawa, T., Nature 391, 773 (1998).CrossRefGoogle Scholar
[19] Khan, A. and Kordesch, M. E., Journal of Physics D: Applied Physics, Submitted 2007.Google Scholar