Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-19T03:39:16.215Z Has data issue: false hasContentIssue false

Enlargement of Grain Size and Location Control of Grain in Excimer-laser Crystallization of Si Film

Published online by Cambridge University Press:  01 February 2011

Wenchang Yeh
Affiliation:
yeh@et.ntust.edu.tw, National Taiwan University of Science and Technology, Electronical Engineering, No.43, Sec.4, Keelung Rd, Taipei, Taipei, N/A, 106, Taiwan, +886-958-201245, +886-2-27376424
Dunyuan Ke
Affiliation:
sk700215@yahoo.com.tw, National Taiwan University of Science and Technology, Electronics, No.43, Sec.4, Keelung Rd., Taipei, N/A, 106, Taiwan
Chunjun Zhuang
Affiliation:
chunjun326@yahoo.com.tw, National Taiwan University of Science and Technology, Electronics, No.43, Sec.4, Keelung Rd., Taipei, N/A, 106, Taiwan
Get access

Abstract

A technique for enlargement of grain size were shown and a technique for location controlled super lateral growth (SLG) grain in excimer laser annealing (ELA) were proposed and realized. In the technique for grain size enlargement, the grain size was enlarged to 10£gm that is more than 10 times larger than that in conventional method(~0.8£gm). The proposed sample structure was Si film/light absorptive film/Glass structure with applying the laser light from the back side of glass substrate. Time resolved(~1ns) optical measurement (TROM) revealed that the melt duration of Si film was increased to 800ns that is also 10 times longer than that in conventional method. As for the grain location control technique, a new method contains pre seeding process and post growth process were proposed and realized. In the pre seeding process, micro light beam(£g-light beam) was exposed to Si film to form a grain within the crystallized spot. £g-light beam was formed by micro-lens-array(MLA). After post growth process, single grain array with the diameters of 6£gm was formed in a period of 10£gm.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kuriyama, H., Kiyama, S., Noguchi, S., Kuwahara, T., Ishida, S., Nohda, T., Sano, K., Iwata, H., Kawata, H., Osumi, M., Tsuda, S., Nakano, ZDS., and Kuwano, Y.., Jpn. J. Appl. Phys. 30,3700(1991).Google Scholar
2. Im, James S. and Kim, H. J., Appl. Phys. Lett., 64(17), 2303 (1994).Google Scholar
3. Hiroshima, Y., Ishihara, R., Rana, V., Abe, D., Inoue, S., Shimoda, T., Metselaar, J., and Beenakker, C., Proceedings of the Active Matrix Liquid Crystal Display 03, 157(2003).Google Scholar
4. Yeh, W.C.,Google Scholar
5. Yeh, W.C., Proceedings of the 1st international TFT conference 2005, 85(2005).Google Scholar
6. Yeh, W.C., Zhuang, Chun-Jun, Chen, Guozhao, Kuo, Chil-Chyuan, Jeng, Jeng-Ywan, Proceedings of the 2nd international TFT conference, (2006).Google Scholar
7. Ozawa, M., Oh, C.H. and Matsumura, M., Jpn. J. Appl. Phys. 38, 5700(1999).Google Scholar
8. Yeh, W.C. and Matsumura, M., Jpn. J. Appl. Phys. 41,1909(2002).Google Scholar
9. Oh, CH., Ozawa, M., and Matsumura, M., Ipn. J. Appl. Phys. 37, L492(1998).Google Scholar
10. Sposili, R.S. and Im, J. S., Appl. Phys. Lett. 69, 2864(1996).Google Scholar
11. , Park, Park, H., Lee, K, Kim, H., and Chung, H., Proceedings of the Active Matrix Liquid Crystal Display 03, 149(2003).Google Scholar
12. Wilt, P. Ch. van der, Dijk, B.D. van, Bertens, G. J., Ishihara, R. and Beenakker, C.I.M.: Appl. Phys. Lett. 72,1819(2001).Google Scholar
13. Kumomi, H., Apl. Phys. Lett. 83, 434(2003)Google Scholar