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Enlargement of Crystal Grain Size and Significant Inclusion of Hexagonal Diamond Phase in Ultra Pure Microcrystalline Silicon

Published online by Cambridge University Press:  17 March 2011

Toshihiro Kamei*
Affiliation:
Center for Integrated Systems, Department of Electrical Engineering, Stanford University, Stanford, CA 94305-4075, USA
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Abstract

We have shown significant effects of atmospheric impurities on crystal grain sizes of hydrogenated microcrystalline Si (μc-Si:H), the growth surface of which is totally covered by hydrogen. By reducing impurity concentrations, two growth modes emerge, bordered at 250°C. In particular, at higher temperature growth mode, strong (220) preferential growth takes place, resulting in increased grain size. Appearance of this growth mode seems to be related to surface monohydride. Sharp x-ray diffraction peak in lower angle than (111) is observed, which stems from (10-10) crystal plane of hexagonal diamond Si. Its formation is related to (220) oriented crystallites. Implication of these results is the possibility of Si polytype control.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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