Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Trusso, Sebastiano
Vasi, Cirino
and
Neri, Fortunato
1999.
Growth and structural properties of hydrogenated silicon films deposited by pulsed laser ablation.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 17,
Issue. 3,
p.
921.
Kleider, J.P.
Longeaud, C.
Brüggemann, R.
and
Houzé, F.
2001.
Electronic and topographic properties of amorphous and microcrystalline silicon thin films.
Thin Solid Films,
Vol. 383,
Issue. 1-2,
p.
57.
Hamma, S
and
Roca i Cabarrocas, P
2001.
Low-temperature growth of thick intrinsic and ultrathin phosphorous or boron-doped microcrystalline silicon films: Optimum crystalline fractions for solar cell applications.
Solar Energy Materials and Solar Cells,
Vol. 69,
Issue. 3,
p.
217.
Vetterl, O
Groß, A
Jana, T
Ray, S
Lambertz, A
Carius, R
and
Finger, F
2002.
Changes in electric and optical properties of intrinsic microcrystalline silicon upon variation of the structural composition.
Journal of Non-Crystalline Solids,
Vol. 299-302,
Issue. ,
p.
772.
Shah, A.V
Meier, J
Vallat-Sauvain, E
Wyrsch, N
Kroll, U
Droz, C
and
Graf, U
2003.
Material and solar cell research in microcrystalline silicon.
Solar Energy Materials and Solar Cells,
Vol. 78,
Issue. 1-4,
p.
469.
Kosku, Nihan
Kurisu, Fumitada
Takegoshi, Miwako
Takahashi, Hiroshi
and
Miyazaki, Seiichi
2003.
High-rate deposition of highly crystallized silicon films from inductively coupled plasma.
Thin Solid Films,
Vol. 435,
Issue. 1-2,
p.
39.
Ram, Sanjay K.
Islam, Md. N.
Roca i Cabarrocas, P.
and
Kumar, Satyendra
2008.
Structural determination of nanocrystalline Si films using ellipsometry and Raman spectroscopy.
Thin Solid Films,
Vol. 516,
Issue. 20,
p.
6863.
Ram, Sanjay K.
Kumar, Satyendra
and
Roca i Cabarrocas, P.
2008.
Influence of the statistical shift of Fermi level on the conductivity behavior in microcrystalline silicon.
Physical Review B,
Vol. 77,
Issue. 4,
Anbarasan, P. M.
Senthilkumar, P.
Manimegalai, S.
Geetha, M.
Vasudevan, K.
Ravi, V.
Deivasagayam, D.
Moorthy Babu, S.
and
Aroulmoji, V.
2010.
Spectral and Morphological Studies of Nanocrystalline Silicon Thin Films Synthesized by PECVD for Solar Cells.
Silicon,
Vol. 2,
Issue. 1,
p.
7.
Kim, Youn J.
Choi, Yoon S.
Shin, Kyung S.
Cho, Sung H.
Choi, In S.
and
Han, Jeon G.
2010.
High deposition rate microcrystalline silicon films prepared by magnetic mirror assisted RF-PECVD.
Current Applied Physics,
Vol. 10,
Issue. 3,
p.
S354.
Bui, Thanh Tung
and
Dang, Mau Chien
2014.
Control of crystalline volume and nano crystal grain size in nanocrystalline silicon thin film deposited by PECVD.
The European Physical Journal Applied Physics,
Vol. 68,
Issue. 2,
p.
20303.
Kumagai, Fuga
Gotoh, Kazuhiro
Miyamoto, Satoru
Kato, Shinya
Kutsukake, Kentaro
Usami, Noritaka
and
Kurokawa, Yasuyoshi
2023.
Bayesian optimization of hydrogen plasma treatment in silicon quantum dot multilayer and application to solar cells.
Discover Nano,
Vol. 18,
Issue. 1,