Hostname: page-component-6b989bf9dc-6f5p8 Total loading time: 0.001 Render date: 2024-04-13T10:50:09.277Z Has data issue: false hasContentIssue false

Effects of Co-Dopants on the Microstrucutre and El Properties of the Zns:Mn Luminescence Materials

Published online by Cambridge University Press:  10 February 2011

Qing Zhai
Affiliation:
Dept. of Materials Science and Engineering
Jinghong Li
Affiliation:
Dept. of Materials Science and Engineering
Jay Lewis
Affiliation:
Dept. of Materials Science and Engineering
Karen Waldrip
Affiliation:
Dept. of Materials Science and Engineering
Kevin Jones
Affiliation:
Dept. of Materials Science and Engineering
Paul Holloway
Affiliation:
Dept. of Materials Science and Engineering
M. Puga-Lambers
Affiliation:
Microfabritech University of Florida, Gainesville, FL 32611
Mark Davidson
Affiliation:
Microfabritech University of Florida, Gainesville, FL 32611
Get access

Abstract

Thin films of zinc sulfide (ZnS) doped with Mn, were deposited using magnetron sputter source. The electroluminescent properties of the as-deposited films were relatively poor. Post- deposition rapid thermal annealing (RTA) with and without co-dopants was studied. Significant changes in microstructure and EL performance were observed on the samples after post-sputter processing. Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) were employed to characterize the microstructure. Both inter-grain and intra-grain distributions of the co-dopants were measured using energy dispersive X-ray spectra (EDX) and the distribution versus thickness was determined by dynamic secondary ion mass spectrometry (SIMS). A correlation between electroluminescent properties and the microstructure is obtained.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Ihanus, J., Ritala, M., Leskela, M., Prohaska, T., Resch, R., Friedbacher, G., Grasserbauer, M., Applied Surface Science, 120, 43 (1997).Google Scholar
2 Ono, Y. A., Electroluminescent Displays, World Scientific, Singapore (1995).Google Scholar
3 Migita, M., Kanehisa, O., Shiiki, M., and Yamamoto, H., J. Cryst. Trowth, 93, 686, (1988).Google Scholar
4 Blackmore, J. M., and Cullis, A. G., Thin Solid Films, 199, 321, (1991).Google Scholar
5 Mikami, A., Terada, K., Okibayashi, K., Tanaka, K., Yoshida, M., and Nakajima, S., J. Appl. Phys., 72, 773, (1992).Google Scholar
6 Steinberger, I. T., Polytypism in Zinc Sulfide, 7, (1982).Google Scholar
7 Chen, C., Husurianto, S., and Koretsky, M. D., J. Electrochem. Soc., 145, 226, (1998).Google Scholar
8 Loginov, Y. Y., Brown, P. D., and Humphreys, C. J., Inst. Phys. Conf. Ser. 146, 431, (1995).Google Scholar
9 Rack, P. D., and Holloway, P. H., Mat. Sci. Eng. R21, 171, (1998).Google Scholar
10 Wang, C. W., Sheu, T. J., Su, Y. K., Yokoyama, M., App. Sur. Sci. 113/114, 709, (1997)K.Google Scholar
11 , Waldrip, Lewis, J., Zhai, Q., Davidson, M., Holloway, P., to be published.Google Scholar
12 Shih, S., Keir, P. D., Wager, J. F., and Viljanen, J., J. Appl. Phys. 78, 5775, (1995).Google Scholar