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The Effect of Layer Thickness on Polycrystalline Zirconia Growth in Zirconia-Alumina Multilayer Nanolaminates

Published online by Cambridge University Press:  15 February 2011

C. M. Scanlan ,
M. D. Wiggins ,
M. Gajdardziska-Josifovska  and
C. R. Aita
C. M. Scanlan
Affiliation:
Materials Department and the Laboratory for Surface Studies, University of Wisconsin-Milwaukee, P.O. Box 784, Milwaukee, WI 53201
M. D. Wiggins
Affiliation:
Materials Department and the Laboratory for Surface Studies, University of Wisconsin-Milwaukee, P.O. Box 784, Milwaukee, WI 53201
M. Gajdardziska-Josifovska
Affiliation:
Department of Physics and the Laboratory for Surface Studies, University of Wisconsin-Milwaukee, P.O. Box 413, Milwaukee, WI 53201
C. R. Aita
Affiliation:
Materials Department and the Laboratory for Surface Studies, University of Wisconsin-Milwaukee, P.O. Box 784, Milwaukee, WI 53201
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Abstract

The mechanical properties of zirconia are known to be a function of phase composition. We show here that a nanolaminate geometry can be used to control the phase composition of zirconia films. The experiment consisted of growth of nanoscale multilayer films (nanolaminates) of polycrystalline zirconia and amorphous alumina by reactive sputter deposition on Si (111) and fused silica substrates. The films were characterized using x-ray diffraction and high resolution electron microscopy. The results show that both monoclinic (m) and tetragonal (t) zirconia polymorphs were formed in the zirconia layers. Most crystallites are oriented with either close-packed {111}-t or {111}-m planes parallel to the substrate. The volume fraction of tetragonal zirconia, the desired phase for transformation-toughening behavior, increases with decreasing zirconia layer thickness. Nanolaminates with a volume fraction of tetragonal zirconia exceeding 0.8 were produced without the addition of a stabilizing dopant, and independent of the kinetic factors that limit tetragonal zirconia growth in pure zirconia films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 343: Symposium H – Polycrystalline Thin Films - Structure, Texture, Properties and Applications , 1994 , 481
Copyright
Copyright © Materials Research Society 1994

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References

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