Hostname: page-component-84b7d79bbc-dwq4g Total loading time: 0 Render date: 2024-07-26T02:22:03.551Z Has data issue: false hasContentIssue false

Defect Production and Annealing in High-Tc Superconductor Euba2cu3oy Irradiated with Energetic Ions at Low Temperature

Published online by Cambridge University Press:  10 February 2011

N. Ishikawa
Affiliation:
Japan Atomic Energy Research Institute, Advanced Science Research Center, Tokai-mura, Ibarakiken 319-11, Japan
Y. Chimi
Affiliation:
Japan Atomic Energy Research Institute, Advanced Science Research Center, Tokai-mura, Ibarakiken 319-11, Japan
A. Iwase
Affiliation:
Japan Atomic Energy Research Institute, Advanced Science Research Center, Tokai-mura, Ibarakiken 319-11, Japan
K. Tsuru
Affiliation:
NTT Integrated Information & Energy Systems Laboratories, Information Hardware Systems Laboratory, Musashino-shi, Tokyo, 180, Japan
O Michikami
Affiliation:
Iwate University., Faculty of Engineering, Morioka-shi, Iwate-ken 020, Japan
Get access

Abstract

The in-situ measurement of fluence dependence of electrical resistivity at 100K has been performed for EuBa2Cu3Oy irradiated at 100K with various energetic ions (Cl, Ni, Br, and I) at energy of 90–200MeV. Decreasing slope of resistivity-fluence curves has been observed for irradiations with 120MeV Cl, 90MeV Ni, and 185MeV Ni, while increasing slope of the curves has been observed for irradiations with 120MeV Br, 125MeV Br, and 200MeV I. It is assumed that the damaged region has a cylindrical shape along ion path and a higher resistivity than the undamaged matrix region. The calculated resistivity-fluence curve fitted well with the experimental data when using the diameter and the resistivity of the damaged region as fitting parameters. The obtained diameter and the resistivity of the damaged region have increased with increasing the electronic stopping power, Se. Successive annealing of the specimens up to 300K after irradiation has resulted in 50–70% recovery of irradiation-induced resistivity change at 100K. The diameter of the damaged region has been larger than that of amorphous tracks observed by transmission electron microscope. This result is discussed in relation to the result of annealing experiment.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Summers, G. P., Burke, E. A., Chrisey, D. B., Nastasi, M., and Tesmer, J. R., Appl. Phys. Lett. 55,1469 (1989).Google Scholar
2. Ishikawa, N., Iwase, A., Chimi, Y., Maeta, H., Tsuru, K., and Michikami, O., Physica C 259,54 (1996).Google Scholar
3. Hardy, V., Groult, D., Hervieu, M., Provost, J., and Raveau, B., Nucl. Instr. Meth. in Phys. Res. B54, 472(1991).Google Scholar
4. Ishikawa, N., Chimi, Y., Iwase, A., Maeta, H., Tsuru, K., Michikami, O., Kambara, T., Mitamura, T., Awaya, Y., and Terasawa, M., to be published in Nucl. Instr. and Meth. in Phys. Res., B.Google Scholar
5. Michikami, O., Asahi, M., and Asano, H., Jpn. J. Appl. Phys. 29, L298 (1990).Google Scholar
6. Biersack, J.P. and Haggmark, L.G., Nucl. Instr. and Meth. 174, 257 (1980).Google Scholar
7. Ishikawa, N., Chimi, Y., Iwase, A., Maeta, H., Tsuru, K., Michikami, O., to be published in J. of Nucl. Mat..Google Scholar
8. Bruggeman, D. A. G., Annalen der Physik [5] 24, 636 (1935).Google Scholar
9. Klaumunzer, S., Rad. Eff. Defects Solids, 126, 141 (1993).Google Scholar
10. Zhu, Y., Cai, Z. X., Budhani, R. C., Suenaga, M., and Welch, D. O., Phys. Rev. B 48, 6436 (1993).Google Scholar