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Correlating Small Angle Scattering Spectra to Electrical Resistivity Changes in a Nickel-base Superalloy

Published online by Cambridge University Press:  01 February 2011

Ricky L Whelchel
Affiliation:
gtg359w@mail.gatech.edu, Georgia Institute of Technology, Materials Science and Engineering, Atlanta, Georgia, United States
V. Siva Kumar G. Kelekanjeri
Affiliation:
sivakumar.vkg@gmail.com, Georgia Institute of Technlogy, Materials Science and Engineering, Atlanta, Georgia, United States
Rosario Gerhardt
Affiliation:
rosario.gerhardt@mse.gatech.edu, Georgia Institute of Technology, Materials Science and Engineering, Atlanta, Georgia, United States
Jan Ilavsky
Affiliation:
ilavsky@aps.anl.gov, Argonne National Laboratory, X-Ray Division, Argonne, Illinois, United States
Ken C. Littrell
Affiliation:
littrellkc@ornl.gov, Oak Ridge National Laboratory, High Flux Isotope Reactor, Oak Ridge, Tennessee, United States
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Abstract

Waspaloy specimens aged at 800°C from 0.5h to 88.5h were evaluated via small angle neutron scattering (SANS), ultra small angle X-ray scattering (USAXS), electrical resistivity, and SEM. The average γ' precipitate size and volume fraction, obtained from modeling the small angle scattering data, was used to calculate a figure of merit of electron scattering. This figure of merit is designed to correlate the electron scattering ability of the material to the precipitate microstructure. The USAXS data shows a secondary precipitate population at smaller diameters that is absent from the SANS data, since the SANS measurements were not obtained at high enough values of Q. It is believed that this secondary population makes the USAXS-derived figure of merit more sensitive to the actual measured resistivity response than the SANS-derived values; however, the SANS derived primary precipitate sizes are believed to more accurate due to a larger sample volume.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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