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Characterization of Nanophase Materials by X-Ray Diffraction and Computer Simulation

Published online by Cambridge University Press:  22 February 2011

J. A. Eastman  and
L. J. Thompson
J. A. Eastman
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439-4838
L. J. Thompson
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439-4838
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Abstract

X-ray diffraction experiments on nanophase Pd have been performed with the primary goal of determining the nature of grain boundary structures in nanophase materials. A kinematical diffraction analysis has been developed to interpret x-ray θ-2θ data by comparing actual scans with scans produced by computer simulation. This simulation program has been used to explore the effects on diffracted intensity of a variety of microstructural and grain boundary structural parameters such as void concentration, grain size, grain boundary width, and changes in interplanar spacing and density in grain boundary regions. It has been found that a reasonable match to experimental data is produced by at least two model structures; in one, the material contains randomly positioned voids or vacancies, while in the other, the interplanar spacings in grain boundary regions are varied with respect to the spacings found in the grain interiors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 153: Symposium J – Interfaces Between Polymers, Metals, and Ceramics , 1989 , 27
Copyright
Copyright © Materials Research Society 1989

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