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Characterization of a Surface Tarnish Found on Daguerreotypes Revealed under Shortwave Ultraviolet Radiation

Published online by Cambridge University Press:  18 July 2014

Aaron Shugar ,
Krista Lough  and
Jiuan Jiuan Chen
Aaron Shugar
Affiliation:
Art Conservation Department, SUNY Buffalo State, Buffalo, New York, USA.
Krista Lough
Affiliation:
Art Conservation Department, SUNY Buffalo State, Buffalo, New York, USA.
Jiuan Jiuan Chen
Affiliation:
Art Conservation Department, SUNY Buffalo State, Buffalo, New York, USA.
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Abstract

A characteristic fluorescent tarnish can be observed on some daguerreotypes under shortwave ultraviolet radiation. The fluorescence can be seen in several distinct patterns: edge tarnish, rings, and continuous films. Dispersive Raman spectroscopy, scanning electron microscopy (SEM), and X-ray diffraction (XRD) were applied to characterize and identify the fluorescent compound. Raman spectroscopy identified the characteristic peak for copper cyanide, CuCN, at 2172 cm-1. Elemental k-ratio maps of the SEM analysis indicated an increase in copper, sodium, carbon and nitrogen in the area of fluorescence. XRD confirmed the identification of a copper cyanide compound. Shortwave ultraviolet radiation can be used in a monitoring program of daguerreotypes to further characterize the fluorescent tarnish and its effect on the deterioration of daguerreotypes.

Keywords

artchemical compositionRaman spectroscopy
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1656: Symposium PP – Materials Issues in Art and Archaeology X , 2014 , pp. 319 - 333
Copyright
Copyright © Materials Research Society 2014 

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