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Artefacts in Ceramics Produced During Preparation and Examination of TEM Specimens

Published online by Cambridge University Press:  21 February 2011

W. E. Lee
Affiliation:
The Ohio State University, Department of Ceramic Engineering, Columbus, Ohio 43210.
M. A. McCoy
Affiliation:
The Ohio State University, Department of Ceramic Engineering, Columbus, Ohio 43210.
S. G. Mhaisalkar
Affiliation:
The Ohio State University, Department of Ceramic Engineering, Columbus, Ohio 43210.
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Abstract

A brief review of possible causes of artefacts in ceramic TEM specimens is illustrated with examples from oxide, silicate and titanate ceramics.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Hockey, B. J.., Proc. Br. Ceram. Soc. No. 20, 95–115 (1972).Google Scholar
2. Howitt, D. G., in Analytical Electron Microscopy – 1981, edited by Geiss, R. H., (San Francisco Press 1981) pp 252256.Google Scholar
3. Howitt, D. G., J. Elec. Mic. Tech. 1, 405 (1984).Google Scholar
4. Thompson-Russell, K. C. and Edington, J. W., Practical Electron Microscopy in Materials Science Monograph 5: Electron Microscope Specimen Preparation Techniques in Materials Science, (Macmillan, 1977) p. 12.Google Scholar
5. Chew, N. G. and Cullis, A. G., Appl. Phys. Lett. 44 142144 (1984).Google Scholar
6. Sands, T. in Materials Problem Solving with the Transmission Electron Microscope, edited by Hobbs, L. W., Westmacott, K. H. and Williams, D. B. (Mater. Res. Soc. Proc. 62, Boston, MA 1985) pp. 2535.Google Scholar
7. Bansal, G. K. and Heuer, A. H., Jernkontorets Ann. 155 (8) 451–53 (1971).Google Scholar
8. Heuer, A. H. (private communication).Google Scholar
9. Lee, W. E., Lagerlof, K. P. D., Mitchell, T. E. and Heuer, A. H., Phil. Mag A 51 (4), L23–L27 (1985).Google Scholar
10. Lee, W. E., Mitchell, T. E. and Heuer, A. H., Rad. Eff. 97 115126 (1986).CrossRefGoogle Scholar
11. Hobbs, L. W., J. Am. Ceram. Soc. 62 (5–6) 267278 (1979).Google Scholar
12. Hobbs, L. W., in Introduction to Analytical Electron Microscopy, edited by Hren, J. J., Goldstein, J. I. and Joy, D. C. (Plenum Press, New York, 1979), p. 437.Google Scholar
13. Veblen, D. R. and Buseck, P. R., Proc. of Forty-First EMSA Meeting, edited by Bailey, G. W., p.350 (1983).Google Scholar
14. Sonder, E. and Sibley, W. A., in Point Defects in Solids, edited by Crawford, J. H. and Slifkin, L. M. (Plenum Press, New York Vol.1, 1972) pp.201–90.CrossRefGoogle Scholar
15. Barry, J. C., Hutchison, J. L. and Segall, R. L., J. Mats. Sci. 18 14211425 (1983).Google Scholar
16. Mhaisalkar, S. G., Lee, W. E. and Readey, D. W., to be published in Proc. First Int'l Conf. on Ceramic Powder Processing Science held at Orlando, FL Nov. 1987.Google Scholar