Hostname: page-component-84b7d79bbc-l82ql Total loading time: 0 Render date: 2024-07-27T14:06:37.056Z Has data issue: false hasContentIssue false
  • English
  • Français

The Application of Neutron Topography to the Study of X-ray Sensitive Organic Crystals - a Possible Alternative to X-ray Topography.

Published online by Cambridge University Press:  21 February 2011

M. Dudley
M. Dudley*
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794, U.S.A.
Get access

Abstract

Neutron topography has been carried out on organic single crystals of varying Xray sensitivity, in order to test the feasibility of the technique as an alternative to X-ray topography for the study of the influence of defects on the solid state reactivity of X-ray sensitive single crystals. Specimens studied include the diacetylene PTS, and Pyrene. A comparison of the strain sensitivity and spatial resolution of the neutron and X-ray based techniques is made. Preliminary results of dynamic neutron topographic studies of the UV induced polymerization in PTS are presented. These results are compared to those obtained from similar X-ray topographic studies.

Results indicate that the neutron technique can be a useful ally technique to the analogous X-ray techniques in studies of the influence of defects on reactivity in specimens of moderate X-ray sensitivity. In cases of extreme sensitivity, the neutron technique is the only one available for studies of this nature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 166: Symposium J – Neutron Scattering for Materials Science , 1989 , 55
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Tanner, B.K., “X-ray Diffraction Topography”, Pergamon, (1976).Google Scholar
2. Tanner, B.K. and Bowen, D.K. (eds.), “Characterization of Crystal Growth Defects by X-ray Methods”, Proceedings of NATO ASI, Series B. Physics, Volume B63, Plenum, (1980).Google Scholar
3. Begg, I.D., Halfpenny, P.J., Hooper, R.M., Narang, R.S., Roberts, K.J., and Sherwood, J.N., Proc. Roy. Soc., A386, 431, (1983).Google Scholar
4. Dudley, M., Sherwood, J.N. and Bloor, D., Polym. Mater. Sci. & Engin., 54, 426, (1986).Google Scholar
5. Baruchel, J., Schlenker, M., Zarka, A., and Petroff, J.F., J. Cryst. Growth, 44, 356, (1978).Google Scholar
6. Schlenker, M. and Baruchel, J., Physica 137B, 309, (1986).Google Scholar
7. Baruchel, J., Phase Transitions 14, 21, (1989).Google Scholar
8. Hooper, R.M. and Sherwood, J.N., J.C.S. Faraday I, 72, 2872, (1976).Google Scholar
9. Dudley, M., Baruchel, J. and Sherwood, J.N., submitted to J. Appl. Cryst., (1989).Google Scholar
10. Baruchel, J., Malgrange, C. and Schlenker, M., in “Position Sensitive Detection of Thermal Neutrons”, Edited by Convert, P. and Forsyth, J.B., Academic Press, London, pp. 400, (1983).Google Scholar
11. Barth, H. and Hosemann, R., Z. Naturf., 13a, 792, (1958).Google Scholar
12. Dudley, M., Mat. Res. Symp. Proc., 143, 253, (1989).Google Scholar
13. Miltat, J.E. and Bowen, D.K., J. Appl. Cryst., 8, 657–669, (1975).Google Scholar
14. Malgrange, C., Petroff, J.F., Sauvage, M., Zarka, A. and Englander, M., Phil. Mag., 33, 743, (1976).CrossRefGoogle Scholar
15. Bacon, G.E., “Neutron Diffraction”, 3rd edition, Clarendon Press, Oxford, (1975).Google Scholar