Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-20T18:49:17.187Z Has data issue: false hasContentIssue false
  • English
  • Français

Advanced TEM Investigations on Ni-Ti Shape Memory Material: Strain and Concentration Gradients Surrounding Ni4Ti3 Precipitates

Published online by Cambridge University Press:  26 February 2011

Dominique Schryvers ,
Wim Tirry  and
Zhiqing Yang
Dominique Schryvers
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium
Wim Tirry
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium
Zhiqing Yang
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium
Get access

Abstract

Lattice deformations and concentration gradients surrounding Ni4Ti3 precipitates grown by appropriate annealing in a Ni51Ti49 B2 austenite matrix are determined by a combination of TEM techniques. Quantitative Fourier analysis of HRTEM images reveals a deformed nanoscale region with lattice deformations up to 2% while EELS and EDX indicate a Ni depleted zone up to 150 nm away from the matrix-precipitate interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 842: Symposium S – Integrative and Interdisciplinary Aspects of Intermetallics , 2004 , S3.6
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Tadaki, T., Nakata, Y., Shimizu, K., Otsuka, K., Trans JIM 27, 731 (1986)Google Scholar
2. Nishida, M., Wayman, C.M., Mater. Sci. Eng. 93, 191 (1987)Google Scholar
3. Nishida, M., Wayman, C.M. and Honma, T., Metal. Trans. A 17, 1505 (1986)Google Scholar
4. Bataillard, L., Bidaux, J.-E., Gotthardt, R., Phil. Mag. A 78, 327 (1998)Google Scholar
5. Khalil-Allafi, J., Dlouhy, A., Eggeler, G., Acta. Mater. 50, 4255 (2002)Google Scholar
6. Filip, P. and Mazanec, K., Scripta Mater. 45, 701 (2001)Google Scholar
7. Zel'dovich, V., Sobyanina, G. and Novoselova, T.V., J. Phys. IV France 7, 299 (1997)Google Scholar
8. Khalil Allafi, J., Ren, X., Eggeler, G., Acta. Mater. 50, 793 (2002)Google Scholar
9. Zou, W. H., Han, X. D., Wang, R., Zhang, Z., Zhang, W-Z, Lai, J. K. L., Mater. Sci. Eng. A 219, 142 (1996)Google Scholar
10. Gall, K., Sehitoglu, H., Chumlyakov, Y.I., Kireeva, I.V., Maier, H.J., J. Eng. Mat. Tech. 121, 19 (1999)Google Scholar
11. Li, D.Y. and Chen, L. Q., Acta. mater. 45, 471 (1997)Google Scholar
12. Somsen, C., “Mikrostrukturelle Untersuchungen an Ni-reichen Ni-Ti Formgedächtnislegierungen”, Shaker Verlag, (2002)Google Scholar
13. Hÿtch, M.J., Scanning Microscopy 11, 54 (1997)Google Scholar
14. Hÿtch, M.J., Snoeck, E., Kilaas, R., Ultramicroscopy 74, 131 (1998)Google Scholar
15. Hÿtch, M.J., Plamann, T., Ultramicroscopy 87, 199 (2001)Google Scholar
16. Tirry, W., Schryvers, D., Acta. Mater. (accepted for publication; October 2004)Google Scholar
17. Mura, T., “Micromechanics of defects in solids”, Nijhoff: Boston, (1982)Google Scholar
18. Choy, Jun-Ho, Lee, Jong K., Mat. Sci. Eng. A 285, 195 (2000)Google Scholar
19. Mueller, R., Gross, D., Comp. Mat. Sci 11, 35 (1998)Google Scholar
20. Egerton, R. F., “Electron Energy-Loss Spectroscopy in the Electron Microscope”, New York, (1996).Google Scholar
21. Cliff, G. and Lorimer, G. W., J. Microscopy, 103, 203 (1975).Google Scholar