Hostname: page-component-6d856f89d9-sp8b6 Total loading time: 0 Render date: 2024-07-16T06:45:55.329Z Has data issue: false hasContentIssue false

Plasma-Assisted Chemical Vapor Deposition Processes

Published online by Cambridge University Press:  29 November 2013

Get access

Extract

Over the past two decades a vast number of publications have emerged from laboratories all over the world, describing the application of plasmas for preparing and processing materials. MRS symposia, scientific journals and books, and complete conference series are solely devoted to this specific topic.

Modern VLSI integrated circuits, for instance, would simply not exist without sophisticated plasma etching techniques. But highly reactive, partly ionized and dissociated, quasi-neutral gases—plasmas—are not only useful for etching purposes, i.e., the removal of materials. They are also very valuable tools for the deposition of materials with unique structures and compositions at lower temperatures than for conventional thermally induced chemical vapor deposition processes. Backed by intensive research activities and more than a decade of practical experiences, plasma deposition technologies are now penetrating a number of industrial manufacturing processes.

Plasmas can be classified into two basic categories — non-isothermal, and isothermal or thermal plasmas.

Within the high electric fields applied for non-isothermal plasma generation at reduced pressure, free electrons are accelerated to energies that correspond to several thousand degrees in the case of thermal activation. The neutral species in the gas phase and the heavy ions are either not influenced by the fields or cannot follow changing fields fast enough. Their temperature stays low, resulting in a difference between electron and gas temperature. In these nonequilibrium plasmas, the collisions of high energy electrons and gas molecules result in dissociation processes that would only occur at very high temperatures of more than 5,000 K in the case of thermal equilibrium. Therefore, non-isothermal plasmas allow the preparation of materials and compositions that are difficult to obtain using thermally activated, conventional CVD. Due to the initiation of chemical reaction by collisions with “hot” electrons rather than hot gas molecules, the processing temperature can, in many cases, be kept lower than in conventional deposition processes.

Type
Deposition Processes
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Plasma Processing, edited by Coburn, J.W., Gottscho, R.A., and Hess, D.W. (Mater. Res. Soc. Symp. Proc. 68, Pittsburgh, PA, 1986).Google Scholar
2.Plasma Chemistry and Plasma Processing (Plenum Press, New York).Google Scholar
3. International Symposia on Plasma Chemistry (ISPC) held bi-annually and alternating with the Gordon Conferences on Plasma Chemistry.Google Scholar
4.Thin Film Processes, edited by Vossen, John L. and Kern, W., (Academic Press, New York, London 1978).Google Scholar
5.Semiconductors and Semimetals, Vol. 21, edited by Pankove, J.I., (Academic Press, New York, 1984).Google Scholar
6.Van den Hoek, W.G.M., in Plasma Processing, edited by Coburn, J.W., Gottscho, R.A., and Hess, D.W. (Mater. Res. Soc. Symp. Proc. 68, Pittsburgh, PA, 1986) p. 335.Google Scholar
7.Küppers, D. and Schelhas, K.H., in Technical Digest, Topical Meeting on Integrated and Guided Wave Optics, Kissimmee, FL (Optical Society of America, 1984), paper ThC6-1.Google Scholar
8.Verspui, G., in Proc. of the Sixth Intl. Conf. on Chemical Vapour Deposition (The Electrochemical Society, 1977) p. 366.Google Scholar
9.Inspektor, A., Carmi, U., Raveh, A., Weitzmann, Y., Mayo, N., and Avni, R., in Proc. of the Sixth European Conf. on Chemical Vapour Deposition, edited by Porat, R. (Iscar Ltd. P.O.B. 34, Nahariya, Israel, 1987).Google Scholar
10.Geittner, P., Küppers, D., and Lydtin, H., Appl. Phys. Lett. 28 (11) (1976) p. 654.CrossRefGoogle Scholar
11.Bachmann, P., Pure & Applied Chemistry, 57 (9) (1985) p. 1299.CrossRefGoogle Scholar
12.Geittner, P., Hagemann, H.J., Warnier, J., and Wilson, H., J. Lightwave Technology, LT-4 (7) (1986) p. 818.CrossRefGoogle Scholar
13.Gleason, E.F. and Hess, D.W., in Plasma Processing, edited by Coburn, J.W., Gottscho, R.A., and Hess, D.W. (Mater. Res. Soc. Symp. Proc 68, Pittsburgh, PA, 1986) p. 343.Google Scholar
14.Shizhi, L., Wu, H., Hongshun, Y., and Zhongshu, W., Plasma Chemistry and Plasma Processing 4 (3), (1984) p. 147.Google Scholar
15.Archer, N., Thin Solid Films, 80 (1981) p. 221.CrossRefGoogle Scholar
16.Secrist, D.R. and MacKenzie, J.D., J. Electrochem Soc., 113 (1966) p. 914.CrossRefGoogle Scholar
17.Ritz, A. and Lydtin, H., to be published in Thin Solid Films (1988).Google Scholar
18.Arya, S.P.S. and D'Amico, A., Thin Solid Films, 157 (1988) p. 267.CrossRefGoogle Scholar
19.Braganza, C., Verprek, S., and Groner, P., J. Nucl. Mater., 85–86 (1979) p. 1133.CrossRefGoogle Scholar
20.Angus, J.C., Koidl, P., and Domitz, S., in Plasma Deposited Thin Films, edited by Mort, J. and Jansen, F. (CRC Press Inc., Boca Raton, FL, 1986) p. 89.Google Scholar
21.Derjaguin, B.V. and Fedoseev, D.V., Growth of Diamond and Graphite from the Gas Phase, (Nauka, Moscow, 1977).Google Scholar
22.Kamo, M., Sato, Y., Matsumoto, S., and Setaka, N., J. Cryst. Growth, 62 (1983) p. 642.CrossRefGoogle Scholar
23.Badzian, A.R., Bachmann, P.K., Hartnett, T., Badzian, T., and Messier, R., in Amorphous Hydrogenated Carbon Films, edited by Koidl, P. and Oelhafen, P. (European Mater. Res. Soc. Symp. Proc. 15, Les Editions de Physique, Paris, 1987) p. 63.Google Scholar
24.Gärtner, G., Janiel, P., and Lydtin, H., in Proc. of the Sixth European Conf. on Chemical Vapour Deposition, edited by Porat, R. (Iscar Ltd. P.O.B. 34, Nahariya, Israel (1987) p. 319.Google Scholar
25.Ensslen, K. and Veprek, S., Plasma Chemistry and Plasma Processing, 7 (1987) p. 139.CrossRefGoogle Scholar
26.Adler, D., in Semiconductors and Semimetals, Vol. 21, edited by Pankove, J.I. (Academic Press, New York, 1984) p. 291.Google Scholar
27.Bryant, W.A., J. Electrochem Soc., 125, 9 (1978) p. 1534.CrossRefGoogle Scholar
28.Nagel, S.R., MacChesney, J.B., and Walker, K.L., IEEE Trans. Microwave Theory and Techniques, MTT-30, 4 (1982) p. 305.CrossRefGoogle Scholar
29.Diamond and Diamond-like Materials Synthesis, edited by Johnson, G.H., Badzian, A.R., and Geis, M.W. (Mater. Res. Soc. Symp. Extended Abstracts, EA-15, Pittsburgh, PA, 1988).Google Scholar
30.Bachmann, P.K., Drawl, W., Knight, D., Weimer, R., and Messier, R., Diamond and Diamond-like Materials Synthesis, edited by Johnson, G.H., Badzian, A.R., and Geis, M.W. (Mater. Res. Soc. Symp. Extended Abstracts, EA-15, Pittsburgh, PA, 1988) p. 99.Google Scholar
31.Koshino, N., Kurihara, K., Kawarada, M., and Sasaki, K., Diamond and Diamond-like Materials Synthesis, edited by Johnson, G.H., Badzian, A.R., and Geis, M.W. (Mater. Res. Soc. Symp. Extended Abstracts, EA-15, Pittsburgh, PA, 1988) p. 95.Google Scholar
32.Geis, M.W., Rathman, D.D., Zayhowski, J.J., Smythe, D., Smith, D.K., and Ditmer, G.A., Diamond and Diamond-like Materials Synthesis, edited by Johnson, G.H., Badzian, A.R., and Geis, M.W. (Mater. Res. Soc. Symp. Extended Abstracts, EA-15, Pittsburgh, PA, 1988) p. 115.Google Scholar