Hostname: page-component-7479d7b7d-q6k6v Total loading time: 0 Render date: 2024-07-11T22:15:23.793Z Has data issue: false hasContentIssue false
  • English
  • Français

Critical Current Properties and Microstructures of Ag-Sheathed Bi-Based Superconducting Wires

Published online by Cambridge University Press:  29 November 2013

T. Kato ,
T. Hikata ,
M. Ueyama ,
K. Sato  and
Y. Iwasa
Get access

Extract

Since the first report of superconductivity in the Bi-Sr-Ca-Cu-O (BSCCO) system by Maeda et al., an enormous quantity of material work has been reported on the Bi system. The Bi-2223 phase exhibits a zero-resistivity temperature of around 110 K and this is the highest critical temperature outside the 125 K critical temperature found in the Tl-Ba-Ca-Cu-O system. The layered BSCCO phases cleave easily, making it possible to align grains by a deformation process.

The powder-in-tube method is one of the fabrication processes that permits grain alignment and the achievement of high critical current density. This tendency is particularly strong for the 2223-BSCCO phase.

In this paper, we report on the relation between the critical current density (Jc) and the microstructure in silver-sheathed Bi-Pb-Sr-Ca-Cu-0 (2223) wires produced by the powder-in-tube method.

Type
High-Temperature Superconductors 1992
Information
MRS Bulletin , Volume 17 , Issue 8 , August 1992 , pp. 52 - 54
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Maeda, H., Tanaka, Y., Fukutomi, M., and Asano, T., Jpn. J. Appl.Phys. 27 (1988) p. 209.CrossRefGoogle Scholar
2.Takano, M., Takada, J., Oda, K., Kitaguchi, H., Miura, Y., Ikeda, Y., Tomii, Y., and Mazaki, H., Jpn. J. Appl.Phys. 27 (1988) p. 1041.CrossRefGoogle Scholar
3.Hikata, T., Nishikawa, T., Mukai, H., Sato, K., and Hitotsuyanagi, H., Jpn. J. Appl. Phys. 28 (1989) p. 1024.Google Scholar
4.Hikata, T., Ueyama, M., Mukai, H., and Sato, K., Cryogenics 30 (1990) p. 924.CrossRefGoogle Scholar
5.Sato, K., Hikata, T., Mukai, H., Ueyama, M., Shibuta, N., Kato, T., Masuda, T., Nagata, M., Iwata, K., and Mitsui, T., IEEE Trans. Magn. 27 (1991) p. 1231.CrossRefGoogle Scholar
6.Ueyama, M., Hikata, T., Kato, T., and Sato, K., Jpn. J. Appl.Phys. 30 (1191) p. 1384.CrossRefGoogle Scholar
7.Hikata, T., Sato, K., and Iwasa, Y., Jpn. J. Appl. Phys. 30 (1991) p. 1271; Physica C 185-189 (1991) p. 2363.CrossRefGoogle Scholar
8.Peterson, R.L. and Ekin, J.W., Physica C 157 (1989) p. 325.CrossRefGoogle Scholar