Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-26T01:30:31.332Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of Synchrotron Surface X-Ray Scattering Studies of Electrochemical Interfaces

Published online by Cambridge University Press:  29 November 2013

Hoydoo You  and
Zoltán Nagy
Get access

Extract

Aqueous-solution/solid interfaces are ubiquitous in modern manufacturing environments as well as in our living environment, and studies of such interfaces are an active area of science and engineering research. An important area is the study of liquid/solid interfaces under active electrochemical control, which has many immediate technological implications, for example, corrosion/passivation of metals and energy storage in batteries and ultracapacitors. The central phenomenon of electrochemistry is the charge transfer at the interface, and the region of interest is usually wider than a single atomic layer, ranging from a monolayer to thousands of angstroms, extending into both phases.

Despite the technological and environmental importance of liquid/solid interfaces, the atomic level understanding of such interfaces had been very much hampered by the absence of nondestructive, in situ experimental techniques. The situation has changed somewhat in recent decades with the development of the largely ex situ ultrahigh vacuum (UHV) surface science, modern spectroscopic techniques, and modern surface microscopy.

However in situ experiments of electrochemical interfaces are difficult, stemming from the special nature of these interfaces. These are so-called buried interfaces in which the solid electrode surface is covered by a relatively thick liquid layer. For this reason, the probe we use in the structural investigation must satisfy simultaneously two conditions: (1) the technique must be surface/interface sensitive, and (2) absorption of the probe in the liquid phase must be sufficiently small for penetration to and from the interface of interest without significant intensity loss.

Type
In Situ Synchrotron Radiation Research in Materials Science
Information
MRS Bulletin , Volume 24 , Issue 1 , January 1999 , pp. 36 - 40
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. For a review article, see Robinson, I.K. and Tweet, D.J., Rep. Prog. Phys. 55 (1992) p. 599.CrossRefGoogle Scholar
2.Adzic, R.R., Advances in Electrochemistry and Electrochemical Engineering, vol. 13, edited by Gerischer, H. and Tobias, C.W. (John Wiley & Sons, New York, 1984) p. 159.Google Scholar
3.Melroy, O.R., Toney, M.F., Borges, G.L., Samant, M.G., Kortright, J.B., Ross, P.N., and Blum, L., Phys. Rev. B 38 (1988) p. 10962; M.F. Toney, J.G. Gordon, M.G. Samant, G.L. Borges, O.R. Melroy, D. Yee, and L.B. Sorensen, Phys. Rev. B 45 (1991) p. 9362.CrossRefGoogle Scholar
4.Ocko, B.M., Wang, J.X., and Wandlowski, Th., Phys. Rev. Lett. 79 (1997) p. 15111 and references therein.CrossRefGoogle Scholar
5.Muller, R.H., Techniques for Characterization of Electrodes and Electrochemical Processes, edited by Varma, R. and Selman, J.R. (John Wiley & Sons, New York, 1992) p. 31.Google Scholar
6.You, H., Melendres, C.A., Nagy, Z., Maroni, V.A., Yun, W., and Yonco, R.M., Phys. Rev. B 45 (1992) p. 11288.CrossRefGoogle Scholar
7.Burke, L.D. and M.Lyons, E.G., in Modern Aspects of Electrochemistry, vol. 18, edited by White, R.E., Bockris, J.O'M., and Conway, B.E. (Plenum Press, New York, 1986) p. 169.Google Scholar
8.Wagner, F.T. and Ross, P.N., J. Electroanal. Chem. 250 (1988) p. 301; Surf. Sci. 160 (1985) p. 305; J. Electroanal. Chem. 150 (1983) p. 141.CrossRefGoogle Scholar
9.Conway, B.E. and Jerkiewicz, G., J. Electroanal. Chem. 339 (1992) p. 123.CrossRefGoogle Scholar
10.Reddy, A.K.N., Genshaw, M.A., and Bockris, J.O'M., J. Chem. Phys. 48 (1968) p. 671.CrossRefGoogle Scholar
11.Angerstein-Kozlowska, H., Conway, B.E., and Sharp, W.B.A., J. Electroanal. Chem. 43 (1973) p. 9; B.E. Conway, B. Barnett, and H. Angerstein-Kozlowska, J. Chem. Phys. 93 (1990) p. 8361.CrossRefGoogle Scholar
12.Clavilier, J., Armand, D., and Wu, B.L., J. Electroanal. Chem. 135 (1982) p. 159 and references therein.CrossRefGoogle Scholar
13.Aberdam, D., Durand, R., Faure, R., and El-Omar, F., Surf. Sci. 171 (1986) p. 303.CrossRefGoogle Scholar
14.You, H., Zurawski, D.J., Nagy, Z., and Yonco, R.M., J. Chem. Phys. 100 (1994) p. 4699.CrossRefGoogle Scholar
15.You, H., Nagy, Z., Zurawski, D.J., and Chiarello, R.P., in Proc. 6th Int. Symp. on Electrode Processes, vol. 96-8, edited by Itaya, K. and Wieckowski, A. (The Electrochemical Society: Pennington, NJ, 1996) p. 136.Google Scholar
16.Schick, M., Walker, J.S., and Wortis, M., Phys. Rev. B 16 (1977) p. 2205.CrossRefGoogle Scholar