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Quantum Dots and Quantum Wires Contribution on Photoluminescent Properties of Nanostructured Oxidized Silicon

Published online by Cambridge University Press:  27 March 2017

C. Vargas ,
T. Ramírez-Cortés ,
K. Cordero-Solano  and
A. Ramírez-Porras
C. Vargas
Affiliation:
Centro de Investigación en Ciencia e Ingeniería de Materiales (CICIMA), Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica Escuela de Física, Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica
T. Ramírez-Cortés*
Affiliation:
Centro de Investigación en Ciencia e Ingeniería de Materiales (CICIMA), Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica Escuela de Física, Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica
K. Cordero-Solano
Affiliation:
Escuela de Física, Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica
A. Ramírez-Porras
Affiliation:
Centro de Investigación en Ciencia e Ingeniería de Materiales (CICIMA), Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica Escuela de Física, Universidad de Costa Rica, San Pedro 11501, San José, Costa Rica
*
*(Email: arturo.ramirez@ucr.ac.cr)
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Abstract

Stability of functional devices such as light-emitting devices and chemical or biological sensors is an important issue nowadays. Nanostructured silicon made using top-down methodologies is being employed as a material to develop such systems, but surface stability to external ambient conditions is still an open question. One of those important conditions is oxidation. Although there exist models accounting for the role of oxide layers on semiconductor systems, experimental data is still required to provide further useful information. In this paper, we perform oxidation processes to light-emitting nanostructured silicon and study the contribution of quantum dots and quantum wires to photoluminescence as surface oxidation evolves. Cross-correlations with infrared spectroscopy are also included.

Keywords

oxidationporositynanostructure
Type
Articles
Information
MRS Advances , Volume 2 , Issue 28: Nanomaterials , 2017 , pp. 1469 - 1474
Copyright
Copyright © Materials Research Society 2017 

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