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Temperature Monitoring of an EM Environment

Published online by Cambridge University Press:  14 March 2018

Denis Fellmann ,
Rachel Bañez ,
Bridget Carragher  and
Clinton S. Potter
Denis Fellmann
Affiliation:
National Resource for Automated Molecular Microscopy and Department of Cell Biology, The Scripps Research Institute, La Jolla, California
Rachel Bañez
Affiliation:
National Resource for Automated Molecular Microscopy and Department of Cell Biology, The Scripps Research Institute, La Jolla, California
Bridget Carragher
Affiliation:
National Resource for Automated Molecular Microscopy and Department of Cell Biology, The Scripps Research Institute, La Jolla, California
Clinton S. Potter*
Affiliation:
National Resource for Automated Molecular Microscopy and Department of Cell Biology, The Scripps Research Institute, La Jolla, California
*
cpotter@scripps.edu

Extract

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The ultimate performance of high resolution electron microscopes depends on a variety of factors including the stability of the temperature surrounding the instrument. Variations in temperature can cause drift of the specimen, the microscope electronics, and the mechanical tolerances in components such as microscope lenses and scan coils. For high resolution work or for image reconstruction that requires acquisition of multiple exposures over extended periods of time, it is critical that the temperature variations be strictly controlled. A typical manufacturer's specification for temperature stability of a room housing a transmission electron microscope (TEM) is a tolerance of <0.5°C/hour with fluctuations of <0.05°C/minute. While modern instrumentation rooms are carefully designed to maintain stable environmental conditions (O'Keefe etal, 2004), it seems unlikely that these stringent specifications are routinely met in practice when the microscope is in operation and personnel are present in the room.

Type
Research Article
Information
Microscopy Today , Volume 14 , Issue 1 , January 2006 , pp. 24 - 29
Copyright
Copyright © Microscopy Society of America 2006

References

References:

O'Keefe, Michael A., Turner, John H., Hetherington, Crispin J.D., Cullis, A.G., Carragher, Bridget, Jenkins, Ron, Julie, Milgrim, Milligan, Ronald.A., Potter, Clinton S., Allard, Lawrence F., Blom, Douglas A., Degenhardt, Lynn, Sides, William H.. (2004) “Laboratory Design for High-Performance Electron Microscopy” Microscopy Today 12, 8–14.Google Scholar
Suloway, Christian; Pulokas, James; Fellmann, Denis; Cheng, Anchi; Guerra, Francisco; Quispe, Joel; Stagg, Scott; Potter, Clinton S; (2005) “Automated Molecular Microscopy: The New Leginon System”, J. Struct. Biol., 151, 41–60.Google Scholar
Potter, Clinton S., Pulokas, James, Smith, Paul, Suloway, Christian and Carragher, Bridget. (2004) “Robotic Grid Loading System for a Transmission Electron Microscope”, JSB, 136, 431–440.Google Scholar