Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-06-22T14:23:09.195Z Has data issue: false hasContentIssue false

Rapid Cross-Section TEM Specimen Preparation of III-V Materials

Published online by Cambridge University Press:  14 March 2018

R. Beanland*
Affiliation:
Bookham Technology plc, U.K.

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Cross-section transmission electron microscope (TEM) specimen preparation of Ill-V materials using conventional methods can be a painful and time-consuming activity, with a day or more from receipt of a sample to examination in the TEM being the norm. This article describes the cross-section TEM specimen preparation technique used at Bookham Caswell. The usual time from start to finish is <1 hour. Up to 10 samples can be prepared at once, depending upon sample type. Most of the tools used are widely available and inexpensive, making the technique ideal for use in institutions with limited resources.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2003

Footnotes

Editor's Note: One of the big pluses associated with the recent International Congress on Microscopy Meeting in Durban, South Africa was the opportunity to visit with old friends. I've known Luc Harmsen, die Groot Baas at Anaspec South Africa, since the last Microscopy Society of Southern Africa's Capetown meeting sometime toward the end of the last century. Anaspec Is a remarkable company that installs and services microscopes literally all over the world. They also put out a hilarious newsletter that Luc has been sending me since the Capetown meeting. Hilarious, yes, but jammed full of extremely useful material. The following is from Anaspec Info, Issue 36/02, October 2002, with Luc's permission. Check out www.anaspec.co.za for the golfing jokes in the referenced issue!

... Ron Anderson, Editor