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Progress Towards More Realistic In-Situ Microscopy Observations

Published online by Cambridge University Press:  14 March 2018

A. Howie
A. Howie*
Affiliation:
Cavendish Laboratory, University of Cambridge, UK

Extract

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As progress indicators in electron microscopy, advances in spatial resolution and in spectroscopy probably attract most frequent attention. Improved user-friendliness has also been significant even when judged in comparison with scanned probe microscopy. Evidence for developments in in-situ microscopy at least equally impressive can be found by comparing the relevant sections of the book by Hirsch et al. and a more recent compilation.

Peter Hirsch's research group swiftly discovered the power and frustrations of in-situ microscopy. The cine film of dislocation motion observed in the earliest diffraction contrast studies, and attributed to the thermal stresses generated by the electron beam, was extremely effective in convincing the wider community that it was indeed dislocations that were being observed.

Type
Research Article
Information
Microscopy Today , Volume 10 , Issue 4 , July 2002 , pp. 5 - 7
Copyright
Copyright © Microscopy Society of America 2002

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